
An Introduction to X-ray Crystallography
Michael M. Woolfson(Author)
Cambridge University Press
2nd Edition
Published on 13. January 1997
Book
Paperback/Softback
416 pages
978-0-521-42359-5 (ISBN)
Description
A textbook for the advanced undergraduate or graduate student beginning a serious study of X-ray crystallography. It will be of interest both to those intending to become professional crystallographers and to those physicists, chemists, biologists, geologists, metallurgists and others who will use it as a tool in their research. All major aspects of crystallography are covered - the geometry of crystals and their symmetry, theoretical and practical aspects of diffracting X-rays by crystals and how the data may be analysed to find the symmetry of the crystal and its structure. Recent advances are fully covered, including the synchrotron as a source of X-rays, methods of solving structures from power data and the full range of techniques for solving structures from single-crystal data. A suite of computer programs is provided for carrying out many operations of data-processing and solving crystal structures - including by direct methods. While these are limited to two dimensions they fully illustrate the characteristics of three-dimensional work. These programs are required for many of the examples given at the end of each chapter but may also be used to create new examples by which students can test themselves or each other.
Reviews / Votes
'... compulsory reading ... extensively revised and updated ... Woolfson was, and remains, a pioneer in this field. His work has revolutionised chemical crystallography ... In summary, this book complements a number of texts in the field destined for advanced undergraduates and postgraduates, making it indispensable reading. The availability of a paperback version at a quite reasonable price serves to reinforce this. No crystallography laboratory should be without it.' Chris Gilmore, Chemistry in Britain '... a comprehensive text of fundamental principles and theory ... I would wholeheartedly recommend this as a solid formal text for the serious X-ray crystallographer.' Keith D. Rogers, Crystallography News '... the new edition has been brought bang up to date with modern crystallographic techniques ... I am delighted to welcome back this authoritative and highly readable textbook.' David C. Palmer, Geological Magazine ' ... highly recommendable to everybody who wishes to understand what he (or she) does when pressing the return key.' P. Luger, Zeitschrift fuer KristallographieMore details
Edition
2nd Revised edition
Language
English
Place of publication
Cambridge
United Kingdom
Target group
College/higher education
Professional and scholarly
Edition type
Revised edition
Product notice
Paperback (trade)
Illustrations
56 Tables, unspecified; 9 Halftones, unspecified; 243 Line drawings, unspecified
Dimensions
Height: 246 mm
Width: 189 mm
Thickness: 22 mm
Weight
801 gr
ISBN-13
978-0-521-42359-5 (9780521423595)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

Michael M. Woolfson
An Introduction to X-ray Crystallography
E-Book
03/2011
2nd Edition
Cambridge University Press
€73.99
Available for download

Michael M. Woolfson
An Introduction to X-ray Crystallography
Book
01/1997
2nd Edition
Cambridge University Press
€123.80
Article exhausted; check for reprint
Previous edition

Michael M. Woolfson
An Introduction to X-ray Crystallography
Book
01/1997
2nd Edition
Cambridge University Press
€123.80
Article exhausted; check for reprint
Person
Content
Preface to the first edition; Preface to the second edition; 1. The geometry of the crystalline state; 2. The scattering of X-rays; 3. Diffraction from a crystal; 4. The Fourier transform; 5. The experimental collection of diffraction data; 6. The factors affecting X-ray intensities; 7. The determination of space groups; 8. The determination of crystal structures; 9. Accuracy and refinement processes; References; Appendices; Physical constants and tables; Solutions to examples; Bibliography; Index.