Microbeam Analysis
Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000
1st Edition
Will be published approx. on 1. January 2000
Book
Hardback
284 pages
978-0-7503-0685-0 (ISBN)
Description
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
More details
Series
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
Professional and scholarly
Professional
Dimensions
Height: 234 mm
Width: 156 mm
Weight
1020 gr
ISBN-13
978-0-7503-0685-0 (9780750306850)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
D. Williams | R. Shimizu
Microbeam Analysis
Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000
E-Book
01/2000
1st Edition
CRC Press
€555.99
Available for download
Persons
D Williams, R Shimizu
Content
Coverage includes: Overview of microanalytical techniques; Interactions of electron and photons with matter; Monte Carlo simulation: a tool to understand practical problems; Analytical electron microscopy; Recent developments in Auger electron spectroscopy and microscopy; Quantification procedures in EPMA; Analysis of thin surface layers and multilayers by EPMA; Standardless quantitative analysis; Image processing and microscopy; Quantification of X-ray spectra; Analysis of ultra-light elements by EPMA; Sample preparation; Applications of energy dispersive spectrometry in materails science; Difficulties in microprobe analysis; Applications of electron energy loss spectroscopy; X-ray emission valence band spectrometry; Radiation damage and charging effects in SEM, EPMA and related techniques; Electron spectroscopy: principles and applications; Future applications.