Testing Digital Circuits
An Introduction
Brian Richard Wilkins(Author)
Cengage Learning EMEA (Publisher)
Published on 30. April 1986
Book
Paperback/Softback
208 pages
978-0-412-38360-1 (ISBN)
Description
This text provides an introduction to the testing of modern digital circuits. Readers will require little previous knowledge of the subject, apart from an understanding of Boolean algebra (including an appreciation of Karnaugh maps and state transition diagrams) and some acquaintenance with standard digital components. The author gives an introduction to the subject, explaining its importance and laying down the principles on which test pattern generation is based. He points out the difficulties that can arise when generating test patterns for unstructured circuits and describes the principles and practice of structured design for testability. Questions at the end of each chapter reinforce the material in the chapter; solution guides are given in a separate chapter at the end of the book. There is also a detailed annotated bibliography covering the standard literature as well as the latest research. This book should be of interest to second and third year undergraduate and diploma students of electrical and electronic engineering; graduate students of information technology, computer science and electronics.
This text provides an introduction to the testing of modern digital circuits. Readers will require little previous knowledge of the subject, apart from an understanding of Boolean algebra (including an appreciation of Karnaugh maps and state transition diagrams) and some acquaintenance with standard digital components. The author gives an introduction to the subject, explaining its importance and laying down the principles on which test pattern generation is based. He points out the difficulties that can arise when generating test patterns for unstructured circuits and describes the principles and practice of structured design for testability. Questions at the end of each chapter reinforce the material in the chapter; solution guides are given in a separate chapter at the end of the book. There is also a detailed annotated bibliography covering the standard literature as well as the latest research. This book should be of interest to second and third year undergraduate and diploma students of electrical and electronic engineering; graduate students of information technology, computer science and electronics.
This text provides an introduction to the testing of modern digital circuits. Readers will require little previous knowledge of the subject, apart from an understanding of Boolean algebra (including an appreciation of Karnaugh maps and state transition diagrams) and some acquaintenance with standard digital components. The author gives an introduction to the subject, explaining its importance and laying down the principles on which test pattern generation is based. He points out the difficulties that can arise when generating test patterns for unstructured circuits and describes the principles and practice of structured design for testability. Questions at the end of each chapter reinforce the material in the chapter; solution guides are given in a separate chapter at the end of the book. There is also a detailed annotated bibliography covering the standard literature as well as the latest research. This book should be of interest to second and third year undergraduate and diploma students of electrical and electronic engineering; graduate students of information technology, computer science and electronics.
More details
Series
Edition
New edition
Language
English
Place of publication
London
United Kingdom
Target group
College/higher education
Edition type
New edition
Illustrations
index
Dimensions
Height: 230 mm
Weight
300 gr
ISBN-13
978-0-412-38360-1 (9780412383601)
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Schweitzer Classification
Content
Testing in context. Test-pattern generation. Aids to test pattern generation. Fault diagnosis. Testing sequential logic. Testing MSI and LSI devices. Enhancing testability. Designing for testability. Self-testing circuits.