
Statistical Pattern Recognition
Andrew Webb(Author)
Butterworth-Heinemann (Publisher)
Published on 27. August 1999
Book
Paperback/Softback
480 pages
978-0-340-74164-1 (ISBN)
No shipping information available
Description
From engineering to statistics, from computer science to the social sciences, 'Statistical Pattern Recognition' shows how closely these fields are related in terms of application. Areas such as database design, artificial neural networks and decision support are common to all. The author also examines the more diverse theoretical topics available to the practitioner or researcher, such as outlier detection and model selection, and concludes each section with a description of the wider range of practical applications and the future developments of theoretical techniques. Providing an introduction to statistical pattern theory and techniques that draws on material from a wide range of fields, 'Statistical Pattern Recognition' is a must for all technical professionals wanting to get up to speed on the recent advances in this dymanic subject area.
Reviews / Votes
... features a "how to" approach with examples and exercises,Lavoiser,More details
Language
English
Place of publication
Oxford
United Kingdom
Publishing group
Elsevier Science & Technology
Target group
Professional and scholarly
Illustrations
99ill.
Dimensions
Height: 280 mm
Width: 330 mm
Weight
905 gr
ISBN-13
978-0-340-74164-1 (9780340741641)
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Schweitzer Classification
Other editions
New editions

Andrew R. Webb
Statistical Pattern Recognition
Book
07/2002
2nd Edition
Wiley
€57.90
Article exhausted; check for reprint
Content
Introduction to statistical pattern recognition * Estimation * Density estimation * Linear discriminant analysis * Nonlinear discriminant analysis - neural networks * Nonlinear discriminant analysis - statistical methods * Classification trees * Feature selection and extraction * Clustering * Additional topics * Measures of dissimilarity * Parameter estimation * Linear algebra * Data * Probability theory.