An Introduction to Surface Analysis by XPS and AES
Published on 25. March 2003
Book
Paperback/Softback
226 pages
978-0-470-84713-8 (ISBN)
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Description
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.
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John F. Watts | John Wolstenholme
An Introduction to Surface Analysis by XPS and AES
Book
03/2003
1st Edition
Wiley
€175.00
Article exhausted; check for reprint
Persons
John F Watts is Professor of Adhesion Science in the School of Engineering at the Unversity Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis.
John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.
John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.
Content
Preface.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative Interpretation.
Compositional Depth Profiling.
Applications of Electron Spectroscopy in Materials Science.
Comparison of XPS and AES with Other Analytical Techniques.
Glossary.
Bibliography.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative Interpretation.
Compositional Depth Profiling.
Applications of Electron Spectroscopy in Materials Science.
Comparison of XPS and AES with Other Analytical Techniques.
Glossary.
Bibliography.