
Storage Reliability and Lifetime Prediction of Electromagnetic Relays
Considering Stress Relaxation
Zhaobin Wang(Author)
Scholars' Press
Published on 3. November 2025
Book
Paperback/Softback
240 pages
978-620-9-21435-6 (ISBN)
Description
As a critical component in electrical and electronic systems, electromagnetic relays are required to meet stringent storage reliability standards. However, current research on their storage reliability remains limited, with existing studies facing several issues: incomplete parameter monitoring during testing, unclear causes of performance variation, insufficient analysis of stress relaxation failure mechanisms, lack of well-defined characterization parameters, suboptimal data modeling methods, and inadequate evaluation and prediction approaches. Consequently, advancing the analysis of storage reliability and the development of lifetime prediction methods for electromagnetic relays has become an urgent challenge.
More details
Language
English
Product notice
Paperback (trade)
Unsewn / adhesive bound
Dimensions
Height: 220 mm
Width: 150 mm
Thickness: 15 mm
Weight
375 gr
ISBN-13
978-620-9-21435-6 (9786209214356)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Person
Zhaobin Wang joined Jiangsu University of Science and Technology, China in 2007 and is currently an Assistant Professor. He received the Ph.D. degree in Electric Machines and Electric Apparatus from Harbin Institute of Technology. His research interest includes storage reliability, testing technique and life - prediction of electrical apparatus.