Scanning Probe Microscopy of Soft Matter
Fundamentals and Practices
1st Edition
Published on 16. November 2011
Book
Hardback
XIX, 642 pages
978-3-527-32743-0 (ISBN)
Description
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,
showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide
range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.
This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy
in soft matter research.
From the contents:
* Atomic Force Microscopy and Other Advanced Imaging Modes
* Probing of Mechanical, Thermal Chemical and Electrical Properties
* Amorphous, Poorly Ordered and Organized Polymeric Materials
* Langmuir-Blodgett and Layer-by-Layer Structures
* Multi-Component Polymer Systems and Fibers
* Colloids and Microcapsules
* Biomaterials and Biological Structures
* Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography
* Microcantilever-Based Sensors
showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide
range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.
This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy
in soft matter research.
From the contents:
* Atomic Force Microscopy and Other Advanced Imaging Modes
* Probing of Mechanical, Thermal Chemical and Electrical Properties
* Amorphous, Poorly Ordered and Organized Polymeric Materials
* Langmuir-Blodgett and Layer-by-Layer Structures
* Multi-Component Polymer Systems and Fibers
* Colloids and Microcapsules
* Biomaterials and Biological Structures
* Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography
* Microcantilever-Based Sensors
More details
Edition
1. Auflage
Language
English
Place of publication
Berlin
Germany
Target group
College/higher education
Professional and scholarly
Illustrations
285
8 farbige Abbildungen, 285 s/w Abbildungen
Dimensions
Height: 24 cm
Width: 17 cm
Thickness: 3.3 cm
Weight
1378 gr
ISBN-13
978-3-527-32743-0 (9783527327430)
Schweitzer Classification
Other editions
Additional editions
Vladimir V. Tsukruk | Srikanth Singamaneni
Scanning Probe Microscopy of Soft Matter
Fundamentals and Practices
E-Book
01/2012
1st Edition
Wiley-VCH
€169.99
Available for download
Vladimir V. Tsukruk | Srikanth Singamaneni
Scanning Probe Microscopy of Soft Matter
Fundamentals and Practices
E-Book
01/2012
1st Edition
Wiley-VCH
€169.99
Available for download
Persons
Vladimir V. Tsukruk received his MS degree in physics from the National University of Ukraine, and his PhD and DSc in chemistry from the National Academy of Sciences of Ukraine. He carried out his post-doc at the universities of Marburg, Germany, and Akron, USA, and is currently
a professor at the School of Materials Science and Engineering, Georgia Institute of Technology. He was elected an APS Fellow in 2010 and an MRS Fellow in 2011. He serves on the editorial advisory boards of five professional journals and has co-authored around 300 refereed articles in archival journals, as well as five books. Professor Tsukruk's research in the fields of surfaces/ interfaces, molecular assembly, nano- and bioinspired materials has been recognized by the Humboldt Research Award and the NSF Special Creativity Award, among others.
Currently an assistant professor in the Department of Mechanical Engineering and Materials Science at Washington University in St. Louis, Srikanth Singamaneni received his MS degree in electrical engineering from Western Michigan University and his PhD in polymer materials
science and engineering from Georgia Institute of Technology. A recipient of the Materials Research Society Graduate Student Gold Award, he has co-authored over 60 refereed articles in archival journals as well as five book chapters. His current research interests include applications
of scanning probe microscopy in biology, physical/chemical sensors based on organic/inorganic hybrids and plasmonic biosensors for label-free and point of care diagnostics.
a professor at the School of Materials Science and Engineering, Georgia Institute of Technology. He was elected an APS Fellow in 2010 and an MRS Fellow in 2011. He serves on the editorial advisory boards of five professional journals and has co-authored around 300 refereed articles in archival journals, as well as five books. Professor Tsukruk's research in the fields of surfaces/ interfaces, molecular assembly, nano- and bioinspired materials has been recognized by the Humboldt Research Award and the NSF Special Creativity Award, among others.
Currently an assistant professor in the Department of Mechanical Engineering and Materials Science at Washington University in St. Louis, Srikanth Singamaneni received his MS degree in electrical engineering from Western Michigan University and his PhD in polymer materials
science and engineering from Georgia Institute of Technology. A recipient of the Materials Research Society Graduate Student Gold Award, he has co-authored over 60 refereed articles in archival journals as well as five book chapters. His current research interests include applications
of scanning probe microscopy in biology, physical/chemical sensors based on organic/inorganic hybrids and plasmonic biosensors for label-free and point of care diagnostics.
Content
PART I: Microscopy Fundamentals
INTRODUCTION
SCANNING PROBE MICROSCOPY BASICS
Basic Principles of Scanning Probe Microscopy
Scanning Tunneling Microscopy
Advent of Atomic Force Microscopy
Overview of Instrumentation
Probes and Cantilevers in Scanning Probe Microscopy
Modes of Operation
Advantages and Limitations
BASICS FOR ATOMIC FORCE MICROSCOPY STUDIES OF SOFT MATTER
Physical Principles: Forces of Interaction
Imaging in Controlled Environment
Artifacts in AFM Imaging of Soft Materials
Some Suggestions and Hints for Avoiding Artifacts
ADVANCED IMAGING MODES
Surface Force Spectroscopy
Friction Force Microscopy
Shear Modulation Force Microscopy
Chemical Force Microscopy
Pulsed-Force Microscopy
Colloidal Probe Microscopy
Scanning Thermal Microscopy
Kelvin Probe and Electrostatic Force Microscopy
Conductive Force Microscopy
Magnetic Force Microscopy
Scanning Acoustic Force Microscopy
High-Speed Scanning Probe Microscopy
PART II: Probing Nanoscale Physical and Chemical Properties
MECHANICAL PROPERTIES OF POLYMERS AND MACROMOLECULES
Elements of Contact Mechanics and Elastic Modulus
Probing of Elastic Moduli for Different Materials: Selected Examples
Adhesion Measurements
Visoelasticity Measurements
Friction
Unfolding of Macromolecules
PROBING OF MICROTHERMAL PROPERTIES
Introduction
Measurements of Glass Transition
Melting, Crystallization, and Liquid Crystalline Phase Transformations
Thermal Expansion of Microstructures
Surface Thermal Conductivity
CHEMICAL AND ELECTRICAL PROPERTIES
Chemical Interactions
Electrochemical Properties
Work Function and Surface Potential
Conductivity
Magnetic Properties
SCANNING PROBE OPTICAL TECHNIQUES
Fundamental Principles
Introduction to Scanning Near-Field Optical Microscopy
Examples of NSOM Studies of Polymers and Polymer Blends
Multicolor NSOM Measurements
Tip-Enhanced Raman Spectroscopy and Microscopy
AFM Tip-Enhanced Fluorescence
Integrating AFM with Fluorescence Optical Microscopy
Integrating AFM with Confocal Raman Microscopy
PART III: Scanning Probe Techniques for Various Soft Materials
AMORPHOUS AND POORLY ORDERED POLYMERS
Introduction
Glassy Amorphous Polymers
Rubbers
Polymer Gels
Interpenetrating Networks
ORGANIZED POLYMERIC MATERIALS
Crystalline Polymers
Liquid Crystalline Polymeric Materials
Periodic Polymeric Structures
HIGHLY BRANCHED MACROMOLECULES
Dendrimers and Dendritic Molecules
Brush Molecules
Hyperbranched Polymers
Star Molecules
Highly Branched Nanoparticles
MULTICOMPONENT POLYMER SYSTEMS AND FIBERS
Polymer Blends
Block Copolymers
Polymer Nanocomposites
Porous Membranes
Micro- and Nanofibers
ENGINEERED SURFACE AND INTERFACIAL MATERIALS
Brush Polymer Layers
Self-Assembled Monolayers
Adsorbed Macromolecules on Different Substrates
LANGMUIR-BLODGETT AND LAYER-BY-LAYER STRUCTURES
LbL Films
Langmuir-Blodgett Films
COLLOIDS AND MICROCAPSULES
Colloids and Latexes
Thin Shell Microcapsules
Replicas and Anisotropic Template Structures
Interfacial Interactions Between Particles and Surfaces
BIOMATERIALS AND BIOLOGICAL STRUCTURES
Imaging Adsorbed Biomacromolecules
Probing Specific Biomolecular Interactions
Mechanics of Individual Biomacromolecules
Single-Cell Elasticity
Lipid Bilayers as Cell Membrane Mimics
PART IV: Nanomanipulation, Patterning, and Sensing
SCANNING PROBE MICROSCOPY ON PRACTICAL DEVICES
Electrical SPM of Active Electronic and Optoelectronic Devices
Magnetic Force Microscopy of Storage Devices
NSOM of Electrooptical Devices and Nanostructures
Friction Force Microscopy of Storage Media and MEMS Devices
NANOLITHOGRAPHY WITH INTRUSIVE AFM TIP
Introduction to AFM Nanolithography
Mechanical Nanolithography
Local Oxidative Nanolithography
Electrostatic Nanolithography
Thermomechanical Nanolithography
DIP-PEN NANOLITHOGRAPHY
Basics of the Ink and Pen Approach
Writing with a Single Pen
Simultaneous Writing with Multiple Pens and Large-Scale DPN
MICROCANTILEVER-BASED SENSORS
Basic Modes of Operation
Thermal and Vapor Sensing
Sensing in Liquid Environment
INTRODUCTION
SCANNING PROBE MICROSCOPY BASICS
Basic Principles of Scanning Probe Microscopy
Scanning Tunneling Microscopy
Advent of Atomic Force Microscopy
Overview of Instrumentation
Probes and Cantilevers in Scanning Probe Microscopy
Modes of Operation
Advantages and Limitations
BASICS FOR ATOMIC FORCE MICROSCOPY STUDIES OF SOFT MATTER
Physical Principles: Forces of Interaction
Imaging in Controlled Environment
Artifacts in AFM Imaging of Soft Materials
Some Suggestions and Hints for Avoiding Artifacts
ADVANCED IMAGING MODES
Surface Force Spectroscopy
Friction Force Microscopy
Shear Modulation Force Microscopy
Chemical Force Microscopy
Pulsed-Force Microscopy
Colloidal Probe Microscopy
Scanning Thermal Microscopy
Kelvin Probe and Electrostatic Force Microscopy
Conductive Force Microscopy
Magnetic Force Microscopy
Scanning Acoustic Force Microscopy
High-Speed Scanning Probe Microscopy
PART II: Probing Nanoscale Physical and Chemical Properties
MECHANICAL PROPERTIES OF POLYMERS AND MACROMOLECULES
Elements of Contact Mechanics and Elastic Modulus
Probing of Elastic Moduli for Different Materials: Selected Examples
Adhesion Measurements
Visoelasticity Measurements
Friction
Unfolding of Macromolecules
PROBING OF MICROTHERMAL PROPERTIES
Introduction
Measurements of Glass Transition
Melting, Crystallization, and Liquid Crystalline Phase Transformations
Thermal Expansion of Microstructures
Surface Thermal Conductivity
CHEMICAL AND ELECTRICAL PROPERTIES
Chemical Interactions
Electrochemical Properties
Work Function and Surface Potential
Conductivity
Magnetic Properties
SCANNING PROBE OPTICAL TECHNIQUES
Fundamental Principles
Introduction to Scanning Near-Field Optical Microscopy
Examples of NSOM Studies of Polymers and Polymer Blends
Multicolor NSOM Measurements
Tip-Enhanced Raman Spectroscopy and Microscopy
AFM Tip-Enhanced Fluorescence
Integrating AFM with Fluorescence Optical Microscopy
Integrating AFM with Confocal Raman Microscopy
PART III: Scanning Probe Techniques for Various Soft Materials
AMORPHOUS AND POORLY ORDERED POLYMERS
Introduction
Glassy Amorphous Polymers
Rubbers
Polymer Gels
Interpenetrating Networks
ORGANIZED POLYMERIC MATERIALS
Crystalline Polymers
Liquid Crystalline Polymeric Materials
Periodic Polymeric Structures
HIGHLY BRANCHED MACROMOLECULES
Dendrimers and Dendritic Molecules
Brush Molecules
Hyperbranched Polymers
Star Molecules
Highly Branched Nanoparticles
MULTICOMPONENT POLYMER SYSTEMS AND FIBERS
Polymer Blends
Block Copolymers
Polymer Nanocomposites
Porous Membranes
Micro- and Nanofibers
ENGINEERED SURFACE AND INTERFACIAL MATERIALS
Brush Polymer Layers
Self-Assembled Monolayers
Adsorbed Macromolecules on Different Substrates
LANGMUIR-BLODGETT AND LAYER-BY-LAYER STRUCTURES
LbL Films
Langmuir-Blodgett Films
COLLOIDS AND MICROCAPSULES
Colloids and Latexes
Thin Shell Microcapsules
Replicas and Anisotropic Template Structures
Interfacial Interactions Between Particles and Surfaces
BIOMATERIALS AND BIOLOGICAL STRUCTURES
Imaging Adsorbed Biomacromolecules
Probing Specific Biomolecular Interactions
Mechanics of Individual Biomacromolecules
Single-Cell Elasticity
Lipid Bilayers as Cell Membrane Mimics
PART IV: Nanomanipulation, Patterning, and Sensing
SCANNING PROBE MICROSCOPY ON PRACTICAL DEVICES
Electrical SPM of Active Electronic and Optoelectronic Devices
Magnetic Force Microscopy of Storage Devices
NSOM of Electrooptical Devices and Nanostructures
Friction Force Microscopy of Storage Media and MEMS Devices
NANOLITHOGRAPHY WITH INTRUSIVE AFM TIP
Introduction to AFM Nanolithography
Mechanical Nanolithography
Local Oxidative Nanolithography
Electrostatic Nanolithography
Thermomechanical Nanolithography
DIP-PEN NANOLITHOGRAPHY
Basics of the Ink and Pen Approach
Writing with a Single Pen
Simultaneous Writing with Multiple Pens and Large-Scale DPN
MICROCANTILEVER-BASED SENSORS
Basic Modes of Operation
Thermal and Vapor Sensing
Sensing in Liquid Environment