
Statistical Quality Control: A Loss Minimization Approach
Dan Trietsch(Author)
World Scientific Publishing Co Pte Ltd
Will be published approx. on 15. April 1999
Book
Hardback
404 pages
978-981-02-3031-9 (ISBN)
Description
While many books on quality espouse the Taguchi loss function, they do not examine its impact on statistical quality control (SQC). But using the Taguchi loss function sheds new light on questions relating to SQC and calls for some changes. This book covers SQC in a way that conforms with the need to minimize loss. Subjects often not covered elsewhere include: (i) measurements, (ii) determining how many points to sample to obtain reliable control charts (for which purpose a new graphic tool, diffidence charts, is introduced), (iii) the connection between process capability and tolerances, (iv) how to adapt Deming's kp rule to quadratic loss, (v) how to adjust without tampering. We also discuss the efficiency of various statistics and how control chart constants are derived.
More details
Series
Language
English
Place of publication
Singapore
Singapore
Target group
College/higher education
Professional and scholarly
Product notice
sewn/stitched
Cloth over boards
Weight
1500 gr
ISBN-13
978-981-02-3031-9 (9789810230319)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Person
Content
Introduction to Shewhart control charts; on measurement; more on accuracy and calibration; partial measurements of quality by loss functions and production costs; asymmetrical loss functions; adjusting processes without tampering; Shewhart control charts for attributes; the relationship between control charts and hypothesis testing; control charts for continuous variables; on the efficiency of various dispersion statistics;; on the computation of control chart factors; more on the optimal subgroup size in Shewhart control charts; pattern tests for Shewhart control charts; basic concepts in time series analysis; diffidence analysis of control charts, and diffidence charts; inspection theory.