Structural, Syntactic, and Statistical Pattern Recognition
Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings
Published on 10. April 2021
Book
Paperback/Softback
XII, 378 pages
978-3-030-73972-0 (ISBN)
Description
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.
The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.
The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.
More details
Series
Edition
1st ed. 2021
Language
English
Place of publication
Cham
Switzerland
Publishing group
Springer International Publishing
Target group
Professional and scholarly
Illustrations
19 s/w Abbildungen, 84 farbige Abbildungen
XII, 378 p. 103 illus., 84 illus. in color.
Dimensions
Height: 235 mm
Width: 155 mm
Thickness: 22 mm
Weight
593 gr
ISBN-13
978-3-030-73972-0 (9783030739720)
DOI
10.1007/978-3-030-73973-7
Schweitzer Classification
Other editions
Additional editions
Andrea Torsello | Luca Rossi | Marcello Pelillo
Structural, Syntactic, and Statistical Pattern Recognition
Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings
E-Book
04/2021
Springer
€53.49
Available for download
Content
Classification and data processing.- Deep learning.- Graph-theoretic methods.- Multimedia analysis and understanding.