
Handbook of Ellipsometry
Edited by Harland Tompkins and Eugene A Haber
William Andrew Publishing
Published on 6. January 2005
Book
Hardback
886 pages
978-0-8155-1499-2 (ISBN)
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Description
The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research. Ellipsometry does not contact or damage samples, and is an ideal measurement technique for determining optical and physical properties of materials at the nano scale. With the acceleration of new instruments and applications now occurring, this book provides an essential foundation for the current science and technology of ellipsometry for scientists and engineers in industry and academia at the forefront of nanotechnology developments in instrumentation, integrated circuits, biotechnology, and pharmaceuticals. Divided into four parts, this comprehensive handbook covers the theory of ellipsometry, instrumentation, applications, and emerging areas. Experts in the field contributed to its twelve chapters, covering various aspects of ellipsometry.
More details
Language
English
Place of publication
Norwich
United States
Target group
Professional and scholarly
Dimensions
Height: 229 mm
Width: 152 mm
Weight
1470 gr
ISBN-13
978-0-8155-1499-2 (9780815514992)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

Harland Tompkins | Eugene A. Irene
Handbook of Ellipsometry
E-Book
01/2005
William Andrew
€250.00
Available for download
Persons
Author
Independent consultant with ties to American Vacuum Society.
University of North Carolina, Chapel Hill, USA
Content
PART 1: THEORY OF ELLIPSOMETRYPolarized Light and EllipsometryOptical Physics of MaterialsData Analysis for Spectroscopic EllipsometryPART 2: INSTRUMENTATIONOptical Components and the Simple PCSA (polarizer, compensator, sample, analyzer) EllipsometerRotating Polarizer and Analyzer EllipsometryPolarization Modulation EllipsometryMultichannel EllipsometryPART 3: APPLICATIONSSiO2 FilmsTheory and Application of Generalized EllipsometryPART 4: EMERGING AREASVUV EllipsometrySpectroscopic Infrared EllipsometryEllipsometry in Life SciencesIndex