Design Process Integration and Characterization For Microelectronics
Tobin(Author)
SPIE Press
Published on 1. January 2002
Book
Paperback/Softback
628 pages
978-0-8194-4439-4 (ISBN)
More details
Language
English
Place of publication
Bellingham
United States
ISBN-13
978-0-8194-4439-4 (9780819444394)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification