Materials Reliability in Microelectronics II: Volume 265
Volume 265
Published on 5. June 2014
Book
Paperback/Softback
344 pages
978-1-107-40968-2 (ISBN)
Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
More details
Series
Language
English
Place of publication
Cambridge
United Kingdom
Target group
College/higher education
Professional and scholarly
Product notice
Paperback (trade)
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 19 mm
Weight
499 gr
ISBN-13
978-1-107-40968-2 (9781107409682)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
C. V. Thompson | J. R. Lloyd
Materials Reliability in Microelectronics II: Volume 265
Book
09/1992
Materials Research Society
€53.41
Article exhausted; check for reprint
Previous edition
C. V. Thompson | J. R. Lloyd
Materials Reliability in Microelectronics II: Volume 265
Book
09/1992
Materials Research Society
€53.41
Article exhausted; check for reprint