Fast Electrical and Optical Measurements
Volume 1 - Current and Voltage Measurements Volume 2 - Optical Measurements
Published on 14. April 1987
Book
Paperback/Softback
XXXVI, 1058 pages
978-94-017-0447-2 (ISBN)
Description
An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).
More details
Series
Edition
Softcover reprint of the original 1st ed. 1986
Language
English
Place of publication
Dordrecht
Netherlands
Target group
Professional and scholarly
Illustrations
XXXVI, 1058 p. In 2 volumes, not available separately.
Dimensions
Height: 23.5 cm
Width: 15.5 cm
ISBN-13
978-94-017-0447-2 (9789401704472)
DOI
10.1007/978-94-017-0445-8
Schweitzer Classification
Other editions
Additional editions
D.J. Thompson | Lawrence H. Luessen
Fast Electrical and Optical Measurements
Volume 1 - Current and Voltage Measurements Volume 2 - Optical Measurements
Book
04/1986
Kluwer Academic Publishers
€85.59
Article exhausted; check different version
Content
Overview of Applications and Needs.- Overview of Applications and Needs.- Voltage and Current Measurements.- Electro-Optical Measurement Techniques.- Electro-Optical and Magneto-Optical Studies of Cold Cathode Electron Beam Gun Discharges.- Fiber Optic Magnetic Field and Current Sensors.- An Electro-Optical Technique for Measuring High Frequency Free-Space Electric Fields.- Electromagnetic Sensors and Measurement Techniques.- Ultrafast Electrical Voltage and Current Monitors.- High Speed Electric Field and Voltage Measurements.- High Speed Magnetic Field and Current Measurements.- Nuclear Reaction Diagnostics for Intense Particle Beam Measurements.- Particle Analyzer Diagnostics for Intense Particle Beam Measurements.- Data Acquisition.- Software Correction of Measured Pulse Data.- Fiber Optic Links for Data Acquisition, Communication, and Control.- A High Speed Multi-Channel Data Recorder.- An Iterative Deconvolution Algorithm for the Reconstruction of High-Voltage Impulses Distorted by the Measuring System.- Test Methods for the Dynamic Performance of Fast Digital Recorders.- Grounding and Shielding.- Electromagnetic Topology for the Analysis and Design of Complex Electromagnetic Systems.- Basic Principles of Grounding and Shielding with Respect to Equivalent Circuits.- System Design: Practical Shielding and Grounding Techniques Based on Electromagnetic Topology.- A Systematic, Practical Approach to the Design of Shielded Enclosures for Data Acquisition and Control.- Fast Photography.- Advances in High Speed Photography: 1972-1982.- Recent Techniques for High-Speed Photography and Low-Level Image Recording.- Laser Photographic and Cinematographic Applications to the Investigation of Transient Phenomena.- Refractive Index Measurements.- Concepts and Illustrations of Optical Probing Diagnostics for Laser-Produced Plasmas.- Sub-Nanosecond, Four-Frame, Holographic Interferometry Diagnostics.- Laser Interferometry: Streaked Shadowgraphy and Schlieren Imaging.- Moire-Schlieren, Time-Differential Interferometry, and Enhanced Sensitivity of Faraday Rotation Measurements.- Twenty-Picosecond Pulsed UV Holographic Interferometry of Laser-Induced Plasmas.- X-Ray Diagnostics.- Nondispersive X-Ray Diagnostics of Short-Lived Plasmas.- High Energy X-Ray Diagnostics of Short-Lived Plasmas.- Fiber Optics in X-Ray Diagnostics Applications.- Flash Radiography.- 3-ns Flash X-Radiography.- Spectroscopy.- Principles of Plasma Spectroscopy.- Spectroscopy of Laser-Produced Plasmas.- Active Optical Techniques.- Laser Induced Fluorescence Techniques.- Multiphoton Techniques for the Detection of Atoms.- Coherent Anti-Stokes Raman Scattering.- Thomson Scattering Diagnostic for Intense Relativistic Electron Beam Experiment.- Appendix A: Ranking of Diagnostic Techniques.- A. K. Hyder, M. F. Rose, M. Kristiansen.- Participants.