
Pattern Recognition
Academic Press
2nd Edition
Published on 26. March 2003
Book
Hardback
689 pages
978-0-12-685875-4 (ISBN)
Article exhausted; check for reprint
Description
*Approaches pattern recognition from the designer's point of view *New edition highlights latest developments in this growing field, including independent components and support vector machines, not available elsewhere *Supplemented by computer examples selected from applications of interest Pattern recognition is a scientific discipline that is becoming increasingly important in the age of automation and information handling and retrieval. This volume's unifying treatment covers the entire spectrum of pattern recognition applications, from image analysis to speech recognition and communications. This book presents cutting-edge material on neural networks, - a set of linked microprocessors that can form associations and uses pattern recognition to learn. A direct result of more than 10 years of teaching experience, the text was developed by the authors through use in their own classrooms.
More details
Edition
2nd Revised edition
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
Professional and scholarly
Edition type
Revised edition
Illustrations
Illustrations
Dimensions
Height: 229 mm
Width: 152 mm
Weight
1000 gr
ISBN-13
978-0-12-685875-4 (9780126858754)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
New editions

Konstantinos Koutroumbas | Sergios Theodoridis
Pattern Recognition
Book
11/2008
4th Edition
Academic Press
€100.50
Shipment within 3-4 weeks

Sergios Theodoridis | Konstantinos Koutroumbas
Pattern Recognition
Book
04/2006
3rd Edition
Academic Press
€51.98
Article exhausted; check for reprint
Additional editions

Sergios Theodoridis | Konstantinos Koutroumbas
Pattern Recognition
E-Book
05/2003
2nd Edition
Academic Press
€63.95
Available for download
Previous edition

Sergios Theodoridis | Konstantinos Koutroumbas
Pattern Recognition
Book
11/1998
Academic Press
€53.22
Article exhausted; check for reprint
Persons
Sergios Theodoridis holds a physics degree from Athens University and an M.Sc. and a Ph.D. degree in electronics and electrical engineering from the University of Birmingham, UK He is currently with the Department of Informatics, University of Athens. His research interests lie in the areas of adaptive signal processing, communications, and pattern recognition. Theodoridis has published more than 40 papers in journals and more than 50 refereed conference papers, and he is the coeditor of Adaptive System Identification and Signal Processing Algorithms. Theodoridis was General Chairman for EUSIPCO 98 and Organizing Chairman of PARPLE 1995, plus he has served as an Associate Editor for IEEE Transactions on Signal Processing. He has held various consultancy posts both in Industry and the Greek Government, and he has participated in a number of European Union funded projects. Konstantinos Koustroumbas holds a computer engineering degree from the University of Patras, an M.Sc. degree from the University of London, UK, and a Ph.D. from Athens University. His research interests lie in the area of neural networks and pattern recognition. Koustroumbas is currently with the Hellenic Telecommunications Organization.
Content
Intro; Classifiers Based on Bayes Decision; Theory; Support Vector machines (linear case); Support Vector Machines; (nonlinear case); Decision trees; Linear Classifiers;; Non Linear Classifiers; Deformable Template Matching; Feature Selection;; Feature Generation I: Linear Transforms; Feature Generation II. Template; Matching; Context Dependent Classification; System Evaluation Clustering: Basic; Concepts; Clustering Algorithms I: Sequential Algorithms; Clustering; Algorithms II: Hierarchical Algorithms; Clustering Algorithms III: Schemes Based; on Function Optimization; Clustering Algorithms IV. Cluster Validity; Appendices.