
Atomic-force Microscopy and Its Applications
IntechOpen (Publisher)
Published on 30. January 2019
Book
Hardback
114 pages
978-1-78985-169-4 (ISBN)
Description
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
More details
Language
English
Place of publication
London
United Kingdom
Target group
College/higher education
Dimensions
Height: 266 mm
Width: 185 mm
Thickness: 13 mm
Weight
469 gr
ISBN-13
978-1-78985-169-4 (9781789851694)
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Schweitzer Classification