Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Published on 13. October 2014
Book
Hardback
616 pages
978-1-84816-789-6 (ISBN)
Description
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
More details
Language
English
Place of publication
London
United Kingdom
Target group
College/higher education
Dimensions
Height: 235 mm
Width: 157 mm
Thickness: 37 mm
Weight
1030 gr
ISBN-13
978-1-84816-789-6 (9781848167896)
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Schweitzer Classification
Person
Content
Introduction; Historical Survey of Development of STEM; Basic Knowledge; Theories for ADF-STEM Image Simulation; Application of ADF-STEM Imaging to Nanomaterials Science; Fitting between STEM Images and the First Principles Structure Calculation; STEM/EELS Elemental Mapping; Three-Dimensional Tomographic Imaging by STEM; Scanning Confocal EM (SCEM); STEM Holography and Lorentz STEM; Future Prospects.