
Mechanical Behavior of Materials and Structures in Microelectronics: Volume 226
Materials Research Society (Publisher)
Published on 1. January 1991
Book
Hardback
472 pages
978-1-55899-120-0 (ISBN)
Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
More details
Series
Language
English
Place of publication
New York
United States
Target group
College/higher education
Professional and scholarly
Illustrations
Worked examples or Exercises
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 25 mm
Weight
790 gr
ISBN-13
978-1-55899-120-0 (9781558991200)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Editor
AT&T Bell Laboratories, New Jersey
The Johns Hopkins University
State University of New York, Buffalo
Osaka City University, Japan
Content
Part I. Metals; Part II. Organic Materials; Part III. Semiconductors; Part IV. Thin Films and Coatings; Part V. Stress-Strain and Fracture Analyses; Part VI. Reliability Issues.