Scanning Tunneling Microscopy
Published on 29. September 1994
Book
Paperback/Softback
459 pages
978-0-12-674050-9 (ISBN)
Description
In little more than a decade, the scanning tunneling microscope (STM) has revolutionized surface science and related fields. This introduction covers the theory, design and applications of scanning tunnelling microscopy and should be of interest to researchers and graduate students in the physical sciences and engineering, especially surface scientists.
More details
Series
Edition
New edition
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
College/higher education
Professional and scholarly
Edition type
New edition
Illustrations
references, index
Dimensions
Height: 235 mm
Width: 159 mm
Weight
645 gr
ISBN-13
978-0-12-674050-9 (9780126740509)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Joseph A. Stroscio | William J. Kaiser
Scanning Tunneling Microscopy
E-Book
10/2013
Academic Press
€70.95
Available for download
Content
Part 1 Theory of scanning tunneling microscopy, J. Tersoff and N.D. Lang; design considerations for an STM system, S.I. Park and R.C. Barrett; extensions of STM, H.K. Wickramasinghe; methods of tunnelling spectroscopy, J.A. Stroscio and R.M. Feenstra. Part 2 Semiconductor surfaces: silicon, R. Becker and R. Wolkow; germanium, R. Becker; gallium arsenide, R.M. Feenstra and J.A. Stroscio; metal surfaces, Y. Kuk; ballistic electron emission microscopy, L.D. Bell, et al; charge-density waves, R.V. Coleman, et al; superconductors, H.F. Hess.