
Optical Methods of Measurement
Wholefield Techniques, Second Edition
Rajpal Sirohi(Author)
CRC Press
2nd Edition
Published on 14. June 2017
Book
Paperback/Softback
316 pages
978-1-138-11549-1 (ISBN)
Description
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections.
The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity.
This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity.
This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
More details
Series
Edition
2nd edition
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
Professional and scholarly
Illustrations
128 s/w Abbildungen, 11 s/w Tabellen
11 Tables, black and white; 128 Illustrations, black and white
Dimensions
Height: 234 mm
Width: 156 mm
Thickness: 17 mm
Weight
485 gr
ISBN-13
978-1-138-11549-1 (9781138115491)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

E-Book
09/2018
2nd Edition
CRC Press
€115.99
Available for download

E-Book
09/2018
2nd Edition
CRC Press
€115.99
Available for download

Book
06/2009
2nd Edition
CRC Press
€304.55
Article not available at the moment
Person
Rajpal S. Sirohi is currently the vice chancellor of Amity University. Prior to this, he was the vice chancellor of Barkatullah University and director of the Indian Institute of Technology Delhi. The recipient of many international awards and author of more than 400 papers, Dr. Sirohi is involved with research concerning optical metrology, optical instrumentation, holography, and speckle phenomenon.
Content
Waves and Beams. Optical Interference. Diffraction. Phase-Evaluation Methods. Detectors and Recording Materials. Holographic Interferometry. Speckle Metrology. Photo-Elasticity. The Moire Phenomenon. Index.