Optical Methods of Measurement
Wholefield Techniques
Rajpal Sirohi(Author)
Marcel Dekker Inc (Publisher)
1st Edition
Published on 1. May 1999
Book
Hardback
328 pages
978-0-8247-6003-8 (ISBN)
Article exhausted; check for reprint
Description
Provides an examination of up-to-date optical measurement techniques employing laser, holographic and digital technology. The text analyzes the most advanced non-invasive methods for measuring stationary or mobile objects and surfaces. It provides information on practical and theoretical issues of reproducing extremely fine spatial resolution in two and three dimensions.
More details
Series
Language
English
Place of publication
New York
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 279 mm
Width: 216 mm
Weight
590 gr
ISBN-13
978-0-8247-6003-8 (9780824760038)
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Schweitzer Classification
Other editions
New editions

Book
06/2009
2nd Edition
CRC Press
€304.55
Article not available at the moment
Persons
Author
Austin, Texas, USA
Editor
Austin, Texas, USA
National University of Singapore
Content
Waves; deffraction; phase evaluation methods; detectors and recording materials; holographic interferometry; speckle metrology; photoelasticity; the Moire phenomenon