Introduction to Optical Metrology
1st Edition
Published on 20. August 2015
Book
Hardback
449 pages
978-1-4822-3610-1 (ISBN)
Description
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text:
Discusses interferometry, speckle metrology, moire phenomenon, photoelasticity, and microscopy
Describes the different principles used to measure the refractive indices of solids, liquids, and gases
Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length
Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements
Depicts a wave propagating in the positive z-direction by ei(?t - kz), as opposed to ei(kz - ?t)
Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Discusses interferometry, speckle metrology, moire phenomenon, photoelasticity, and microscopy
Describes the different principles used to measure the refractive indices of solids, liquids, and gases
Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length
Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements
Depicts a wave propagating in the positive z-direction by ei(?t - kz), as opposed to ei(kz - ?t)
Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Reviews / Votes
"A good book for students and professionals to learn both basic and practical aspects of optical metrology."-Mitsuo Takeda, Center for Optical Research and Education, Utsunomiya University, Japan
"The theory and practice of optical metrology is equally weighted in this book, an ideal combination for the instructor, student, and researcher."
-Ramen Bahuguna, San Jose State University, California, USA
"The author's way of writing/explaining is very well adapted to students and practical-thinking persons. The didactics show the long experience of the author."
-W. Osten, University Stuttgart, Germany
More details
Series
Language
English
Place of publication
Bosa Roca
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
Professional and scholarly
Illustrations
284 s/w Abbildungen, 16 s/w Tabellen
16 Tables, black and white; 284 Illustrations, black and white
Dimensions
Height: 234 mm
Width: 156 mm
Weight
990 gr
ISBN-13
978-1-4822-3610-1 (9781482236101)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
New editions
Rajpal S. Sirohi
Introduction to Optical Metrology
Book
09/2025
2nd Edition
CRC Press
€188.90
Shipment within 10-20 days
Person
Rajpal S. Sirohi, Ph.D, is currently chair professor of the Physics Department at Tezpur University, India, and senior editor of Optical Engineering. Previously, he was director of the Indian Institute of Technology Delhi; vice-chancellor of Barkatullah University, Bhopal; vice-chancellor of Shobhit University, Meerut; and vice-chancellor of Amity University, Jaipur. He also served in various capacities at the Indian Institute of Science, Bangalore; Indian Institute of Technology Madras, Chennai; Case Western Reserve University, Cleveland, Ohio, USA; Rose-Hulman Institute of Technology, Terre Haute, Indiana, USA; Institute for Advanced Studies, University of Malaya, Malaysia; University of Namibia; National University of Singapore; and Ecole Polytechnique Federale de Lausanne, Switzerland. Widely published and highly decorated, Professor Sirohi is or has been a fellow, honorary fellow, invited fellow, member, board member, and former president of numerous scientific academies, associations, committees, societies, and journals.
Content
Introduction to Optics. Laser Beams. Sources, Detectors, and Recording Media. Interferometry. Techniques. Measurement of Refractive Index. Measurement of Radius of Curvature and Focal Length. Optical Testing. Angle Measurement. Thickness Measurement. Measurement of Velocity. Pressure Measurement. Fiber Optic- and MEM-Based Measurements. Length Measurement.