Extreme Statistics in Nanoscale Memory Design
Springer (Publisher)
Published on 13. September 2010
Book
Paperback/Softback
258 pages
978-1-4419-6607-0 (ISBN)
More details
Language
English
Place of publication
United States
Product notice
Paperback (trade)
Unsewn / adhesive bound
Illustrations
black & white illustrations
Dimensions
Height: 234 mm
Width: 156 mm
Thickness: 14 mm
Weight
367 gr
ISBN-13
978-1-4419-6607-0 (9781441966070)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Persons
Editor
Carnegie Mellon Univ. Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University Carnegie Mellon University