VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Published on 18. August 2019
Book
Paperback/Softback
XVI, 775 pages
978-981-329-766-1 (ISBN)
Description
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
More details
Series
Edition
2019 ed.
Language
English
Place of publication
Singapore
Singapore
Target group
Professional and scholarly
Illustrations
209 s/w Abbildungen, 336 farbige Abbildungen
XVI, 775 p. 545 illus., 336 illus. in color.
Dimensions
Height: 235 mm
Width: 155 mm
Thickness: 43 mm
Weight
1177 gr
ISBN-13
978-981-329-766-1 (9789813297661)
DOI
10.1007/978-981-32-9767-8
Schweitzer Classification
Other editions
Additional editions
Anirban Sengupta | Sudeb Dasgupta | Virendra Singh
VLSI Design and Test
23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
E-Book
08/2019
Springer
€106.99
Available for download
Content
Analog and Mixed Signal Design.- Computing Architecture and Security.- Hardware Design and Optimization.- Low Power VLSI and Memory Design. -Device Modelling.- Hardware Implementation.