Intermittent Failures in Integrated Circuits 2016
Detection, Characterization and Fault Tolerance
Published on 6. January 2016
Book
Hardback
300 pages
978-1-4419-8314-5 (ISBN)
Description
This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.
More details
Edition
2015 ed.
Language
English
Place of publication
New York, NY
United States
Target group
Professional and scholarly
Research
Illustrations
biography
Dimensions
Height: 0 mm
Width: 0 mm
ISBN-13
978-1-4419-8314-5 (9781441983145)
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Schweitzer Classification
Content
Fundamentals of VLSI Testing.- Circuit Marginality and Noise Sources.- Fault Modeling for Intermittent Errors.- Automatic Test Pattern Generation.- Design-for-Testability.- Test Economics and Cost-Benefit Analysis.- Layout Level Fault Tolerance.- Circuit Level Fault Tolerance.- Gate Level Fault Tolerance.- System Level Fault Tolerance.- Information Level Fault Tolerance.