
Practical Electron Microscopy Of Lattice Defects
Hiroyasu Saka(Author)
World Scientific Publishing Co Pte Ltd
Published on 26. April 2021
Book
Hardback
308 pages
978-981-12-3469-9 (ISBN)
Description
'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
More details
Language
English
Place of publication
Singapore
Singapore
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 235 mm
Width: 157 mm
Thickness: 21 mm
Weight
602 gr
ISBN-13
978-981-12-3469-9 (9789811234699)
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Schweitzer Classification