Surface Characterization of Advanced Polymers
Published on 1. July 1993
Book
Hardback
XIV, 304 pages
978-3-527-28512-9 (ISBN)
Description
A comprehensive approach to the surface analysis of polymers of technological interest by means of modern electron and ion spectroscopies (XPS, ToF-SIMS, ISS, HREELS). Case studies are critically discussed by experts in the field who propose strategies for the unequivocal interpretation of surface analyses. Newcomers to the field should benefit from the extensive introductory chapter describing spectroscopy fundamentals. This is a specialized book, written at an easily comprehensible level. It is recommended to all people involved in surface characterization and chemical analysis and, more generally, interested in polymer science and advanced materials.
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Content
Spectroscopies for surface characterization; electron induced vibrational spectrosocopy (HREELS); time-of-flight secondary ions mass spectrometry; investigation of advanced polymers by ions scattering spectrosocopy (ISS); X-ray photoelectron spectroscopy analysis of conducting polymers; chemical derivatization methods for enhancing the analytical capabilities of X-ray photoelectron spectroscopy and static secondary ion mass spectrometry; data analysis and treatment in XPS.