Advances in X-Ray Analysis
Volume 25
Published on 24. July 2012
Book
Paperback/Softback
XVIII, 398 pages
978-1-4613-9995-7 (ISBN)
Description
In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction. This is a "fluorescence" year, and the three invited lecturers are experts in techniques that are at, or perhaps yet a bit beyond, the forefront of our understanding and technology in that field. The common denominator in selecting these subjects was that each is approaching a full elucidation of theory, and active develop ment of practical hardware, and that each presents analytical pos sibilities which can hardly be ignored in the next generation of commercial instrumentation. In other words, these are techniques that many of us shall likely find ourselves using by the end of the decade. The greatest difficulty in selecting the subjects was the need to overlook others, particularly 1) the increasing inter est in "in-situ" or on-line analytical control, for tagging, identi fication or sorting; and 2) the broad subject of the computeriza tion of instrumentation, with its powerful impact on the design of hardware, and its open invitation to the theorist to create more exact mathematical models of the analytical process, regardless of complexity, in the expectation that programmers will find ways to implement solutions in affordable, dedicated computers.
More details
Edition
Softcover reprint of the original 1st ed. 1982
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Illustrations
104 s/w Abbildungen
XVIII, 398 p. 104 illus.
Dimensions
Height: 244 mm
Width: 170 mm
Thickness: 23 mm
Weight
721 gr
ISBN-13
978-1-4613-9995-7 (9781461399957)
DOI
10.1007/978-1-4613-9993-3
Schweitzer Classification
Other editions
Additional editions
John C. Russ
Advances in X-Ray Analysis: Volume 25
Book
05/1982
Kluwer Academic/Plenum Publishers
€109.13
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Content
I. XRF Detectors and XRF Instrumentation.- Solid-State Room-Temperature Energy Dispersive X-Ray Detectors.- Preliminary Study of the Behavior of HPGe Detectors with Ion Implanted Contacts in the Ultralow-Energy X-Ray Region.- Performance of Room-Temperature X-Ray Detectors Made from Mercuric Iodide (HgI2) Platelets.- The Gas Proportional Scintillation Counter as a Room Temperature Detector for Energy Dispersive X-Ray Fluorescence Analysis.- Performance Characteristics of a High Resolution Si(Li) Detector Using a Time Variant Amplifier and a Pulsed Source of X-Rays.- X-Ray Tubes for Energy Dispersive XRF Spectrometry.- Toroidal Monochromators in Hybrid XRF System Improve Effectiveness of EDXRF Ten Fold.- II. XRF Methods: Practical, Mathematical.- The Use of Polarized X-Rays for Improved Detection Limits in Energy Dispersive X-Ray Spectrometry.- X-Ray Fluorescence of Intermediate-to High-Atotaic-Number Elements Using Polarized X Rays.- Examples of Analysis from an Integrated X-Ray Fluorescence Analysis System Using NRLXRF.- A Modular ADC/Microcomputer System for Energy Dispersive X-Ray Spectroscopy.- Volatilization,of Sulfur in Fusion Techniques for Preparation of Discs for X-Ray Fluorescence Analysis.- Techniques for the Preparation of Lithium Tetraborate Fused Single and Multielement Standards.- III. XRF Applications: Mineral and Geological.- The Use of EDXRF for Liquids in a Uranium-Vanadium Solvent Extraction Process.- A Resin-Loaded Paper X-Ray Fluorescence Method for Determining Uranium in Phosphate Materials.- The X-Ray Analysis of Uranium Ores for Iron Sulfide Minerals.- A Statistical Comparison of Data Obtained from Pressed Disk and Fused Bead Preparation Techniques for Geological Samples.- Trace and Minor Element Analysis of Obsidian from the San Francisco Volcanic Field Using X-Ray Fluorescence.- Quantitative Determination of Ga, Zn, Cu, Ni, Mn, and Cr by X-Ray Fluorescence in Laterites and Bauxites Using Two Evaluation Methods.- A Combined Dilution and Line-Overlan Coefficient Solution for the Determination of Rare Earths in Monazite Concentrates.- Feasibility Study for On-Stream X-Ray Analysis of Barite.- IV. XRF Applications. Metals, Catalysts, Oils.- "Standard-Background" Method of X-Ray Spectral Analysis for Quality Control of Noble Metals in Alumina-Based Automobile Exhaust Catalysts.- Some Elemental Determinations of Catalytic Materials Using a Thin-Film Internal Standard Technique by Radioisotope Excited X-Ray Fluorescence.- Energy Dispersive X-Ray Measurements for Cesium and Silver in Zeolite Ion-Exchange Columns.- Direct Analysis of Plutonium Metal for Gallium, Iron and Nickel by Energy Dispersive X-Ray Spectrometry.- The Analysis of Copner Alloys by Chem-X, Low Power F?DX Multichannel Spectrometer.- Energy Dispersive XRF Analysis of Lubricating Oil Additives with Secondary Target Excitation and the EXACT Fundamental Parameters Program.- The Analysis of Oil Additives Using Fundamental Influence Coefficients.- V. XRF Environmental Applications.- The Measurement of Low Concentrations of Organic and Inorganic Gaseous Contaminants in Occupational Environments by X-Ray Spectrometry (XRS).- The Application of X-Ray Fluorescence and Diffraction to the Characterization of Environmental Assessment Samples.- Accurate PIXE Analysis of Thin Samples, Aerosol Loaded Filters and Surface Layers of Thick Samples.- Energy Dispersive Analysis of Actinides, Lanthanides, and Other Elements in Soil and Sediment Samples.- X-Ray Fluorescence Analysis of Welding Fume Particles.- VI. XRD Search/Match Procedures and Automation.- A NewComputer Algorithm for Qualitative X-Ray Powder Diffraction Analysis.- A Versatile Minicomputer X-Ray Search/Match System.- Automatically Correcting for Specimen Displacement Error During XRD Search/Match Identification.- X-Ray Diffraction Phase Analysis Using Microcomputers.- A Second Generation Automated Powder Diffractometer Control System.- Application of the Modified Snyder's Program for the Data Processing of an Automated X-Ray Powder Diffractometer.- INDEX, A Program to Reconcile Powder Diffractograms.- IDENT - A Versatile Microfile-Based System for Fast Interactive XRPD Phase Analysis.- VII. XRD Methods and Instrumentation.- Complete Quantitative Analysis Using Both X-Ray Fluorescence and X-Ray Diffraction.- Calibration of the Diffractometer at Low Values of Two Theta.- Schreiner Sample Preparation and Methodology for X-Ray Quantitative Analysis of Thin Aerosol Layers Deposited on Glass Fiber and Membrane Filters.- Differential X-Ray Diffraction by Wavelength Variation: A Preliminary Investigation.- X-Ray Diffraction Quantitative Analysis Using Intensity Ratios and External Standards.- A Guinier Diffractometer with a Scanning Position Sensitive Detector.- Observation of an X-Ray Beam of 10 Microradian Divergence Without Using Any Collimator.- VIII. XRD Applications.- X-Ray Residual Stress Mapping in Industrial Materials by Energy Dispersive Diffractometry.- Stress Measurement and Precision Diffraction Angles on Large Grained Specimens.- Determination of Residual Stresses in Austenite and Martensite in Case-Hardened Steels by the Sin2? Method.- X-Ray Characteristics and Applications of Layered Synthetic Microstructures.- The Use of Energy Dispersive Diffractometry to Measgre the Thickness of Metal and Glass Thin Films.- Application of Automated X-RayDiffraction to Alteration Mineral Zoning Studies.- The Application of X-Ray Diffraction for Glass Batch Homogeneity Determination.- X-Ray Diffraction and Fluorescence in the Analysis of Pharmaceutical Excipients.- Corrections to Volume 24..- Author Index.