Physical Methods of Chemistry, Investigations of Surfaces and Interfaces
2nd Edition
Will be published approx. on 6. July 1993
Book
Hardback
768 pages
978-0-471-54405-0 (ISBN)
Description
Each volume of this series heralds profound changes in both the perception and practice of chemistry. This edition presents the state of the art of all important methods of instrumental chemical analysis, measurement and control. Contributions offer introductions together with sufficient detail to give a clear understanding of basic theory and apparatus involved and an appreciation of the value, potential and limitations of the respective techniques. The emphasis of the subjects treated is on method rather than results, thus aiding the investigator in applying the techniques successfully in the laboratory.
More details
Series
Edition
Volume 9, Part B
Language
English
Place of publication
United States
Publishing group
John Wiley & Sons Inc
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 240 mm
Width: 165 mm
Thickness: 40 mm
Weight
1247 gr
ISBN-13
978-0-471-54405-0 (9780471544050)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Bryant W. Rossiter is the editor of Physical Methods of Chemistry, 2nd Edition, Volume 9, Part B, Investigations of Surfaces and Interfaces, 2nd Edition, published by Wiley. Roger C. Baetzold is the editor of Physical Methods of Chemistry, 2nd Edition, Volume 9, Part B, Investigations of Surfaces and Interfaces, 2nd Edition, published by Wiley.
Content
Surface Crystallography by Low-Energy Electron Diffraction (G. Somorjai & M. Van Hove).
Analysis of Surfaces by Auger Electron Spectroscopy and Related Techniques (L. Kazmerski).
The Analysis of Surfaces by X-Ray Photoelectron Spectroscopy (N. Turner).
Low-Energy Ion Scattering and Rutherford Backscattering Spectroscopies (A. Miller, et al.).
X-Ray Absorption Spectroscopy (Surface Extended and Near-Edge X-Ray Absorption Fine Structure) at Surfaces (D. Norman).
Monolayer Assemblies (H. Kuhn & D. Mobius).
Applications of Spectroscopic Techniques to the In Situ Study of Electrochemical Interfaces (D. Scherson & E. Yeager).
Surface-Enhanced Raman Scattering (E. Brandt & T. Cotton).
Index.
Analysis of Surfaces by Auger Electron Spectroscopy and Related Techniques (L. Kazmerski).
The Analysis of Surfaces by X-Ray Photoelectron Spectroscopy (N. Turner).
Low-Energy Ion Scattering and Rutherford Backscattering Spectroscopies (A. Miller, et al.).
X-Ray Absorption Spectroscopy (Surface Extended and Near-Edge X-Ray Absorption Fine Structure) at Surfaces (D. Norman).
Monolayer Assemblies (H. Kuhn & D. Mobius).
Applications of Spectroscopic Techniques to the In Situ Study of Electrochemical Interfaces (D. Scherson & E. Yeager).
Surface-Enhanced Raman Scattering (E. Brandt & T. Cotton).
Index.