
X-Parameters
Characterization, Modeling, and Design of Nonlinear RF and Microwave Components
Cambridge University Press
Published on 26. September 2013
Book
Hardback
233 pages
978-0-521-19323-8 (ISBN)
Description
This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering.
Reviews / Votes
'This book is an excellent treatise by experts from Agilent on the assumption and use of x-parameters.' Alfy Riddle, IEEE Microwave MagazineMore details
Series
Language
English
Place of publication
Cambridge
United Kingdom
Target group
College/higher education
Illustrations
154 Line drawings, unspecified
Dimensions
Height: 250 mm
Width: 175 mm
Thickness: 17 mm
Weight
594 gr
ISBN-13
978-0-521-19323-8 (9780521193238)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

David E. Root | Jan Verspecht | Jason Horn
X-Parameters
Characterization, Modeling, and Design of Nonlinear RF and Microwave Components
E-Book
10/2013
1st Edition
Cambridge University Press
€100.99
Available for download

David E. Root
X-Parameters
Characterization, Modeling, and Design of Nonlinear RF and Microwave Components
E-Book
09/2013
Cambridge University Press
€84.99
Available for download
Persons
David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011). Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE. Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements. Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.
Content
1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory.