Materials Reliability in Microelectronics III: Volume 309
Published on 31. August 1993
Book
Hardback
516 pages
978-1-55899-205-4 (ISBN)
Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
More details
Series
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Illustrations
Worked examples or Exercises
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 29 mm
Weight
860 gr
ISBN-13
978-1-55899-205-4 (9781558992054)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
New editions
Kenneth P. Rodbell | William F. Filter | Harold J. Frost
Materials Reliability in Microelectronics III: Volume 309
Volume 309
Book
06/2014
Cambridge University Press
€41.20
Shipment within 15-20 days
Additional editions
Kenneth P. Rodbell | William F. Filter | Harold J. Frost
Materials Reliability in Microelectronics III: Volume 309
Volume 309
Book
06/2014
Cambridge University Press
€41.20
Shipment within 15-20 days