Materials Reliability in Microelectronics III: Volume 309
Volume 309
Published on 5. June 2014
Book
Paperback/Softback
514 pages
978-1-107-40948-4 (ISBN)
Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
More details
Series
Language
English
Place of publication
Cambridge
United Kingdom
Target group
College/higher education
Professional and scholarly
Product notice
Paperback (trade)
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 27 mm
Weight
736 gr
ISBN-13
978-1-107-40948-4 (9781107409484)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Kenneth P. Rodbell | William F. Filter | Harold J. Frost
Materials Reliability in Microelectronics III: Volume 309
Book
08/1993
Materials Research Society
€53.41
Article exhausted; check for reprint
Previous edition
Kenneth P. Rodbell | William F. Filter | Harold J. Frost
Materials Reliability in Microelectronics III: Volume 309
Book
08/1993
Materials Research Society
€53.41
Article exhausted; check for reprint