
Transmission Electron Microscopy
Physics of Image Formation
Springer (Publisher)
5th Edition
Published on 19. November 2010
Book
Paperback/Softback
XVI, 590 pages
978-1-4419-2308-0 (ISBN)
Description
The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
Reviews / Votes
From the reviews of the fifth edition:
"A classical monograph on the physics of image formation, electron-specimen interactions, and image interpretation in transmission electron microscopy. . the student and the instructor can find applications of many fundamental concepts of physics in this book. . could be used, of course by scientists in the field of transmission electron microscopy and by students attending a summer school on the technique. . In conclusion, this book will probably be found in libraries and on the shelves of the expert in transmission electron microscopy . ." (Gary J. Long, Belgian Physical Society Magazine, Issue 1, 2011)More details
Series
Edition
Fifth Edition 2008
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Edition type
Revised edition
Product notice
Paperback (trade)
Unsewn / adhesive bound
Illustrations
276 s/w Abbildungen
XVI, 590 p. 276 illus.
Dimensions
Height: 236 mm
Width: 154 mm
Thickness: 35 mm
Weight
904 gr
ISBN-13
978-1-4419-2308-0 (9781441923080)
DOI
10.1007/978-0-387-40093-8
Schweitzer Classification
Other editions
Additional editions

Book
08/2008
5th Edition
Springer
€192.59
Shipment within 5-7 days
Content
Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron-Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ..- Imaging of Crystalline Specimens and Their Defects..- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy..- Specimen Damage by Electron Irradiation.