Energy-Filtering Transmission Electron Microscopy
Ludwig Reimer(Editor)
Springer (Publisher)
Published on 11. April 1995
Book
Hardback
XIII, 425 pages
978-3-540-58479-7 (ISBN)
Description
Energy-Filtering Transmission Electron Microscopy
(EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.
Reviews / Votes
"This book gives an excellent introduction to the topic...and can be advised both as a text book for researchers new in this field as well as those looking for a basic reference to the topic." - PhysicaliaMore details
Series
Language
English
Place of publication
Heidelberg
Germany
Publishing group
Springer Berlin
Target group
College/higher education
Professional and scholarly
Illustrations
157
157 s/w Abbildungen
199 illustrations, 10 tables
Dimensions
Height: 23.5 cm
Width: 15.5 cm
Weight
790 gr
ISBN-13
978-3-540-58479-7 (9783540584797)
DOI
10.1007/978-3-540-48995-5
Schweitzer Classification
Other editions
Additional editions

Ludwig Reimer
Energy-Filtering Transmission Electron Microscopy
Book
11/2013
Springer
€53.49
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Persons
Editor
Contributions
Guest editor
Content
1. Introduction.- 2. Electron Optics of Imaging Energy Filters.- 3. Plasmons and Related Excitations.- 4. Inner-Shell Ionization.- 5. Quantitative Electron Energy-Loss Spectroscopy.- 6. Electron Spectroscopic Diffraction.- 7. Electron Spectroscopic Imaging.- 8. Energy-Filtered Reflection Electron Microscopy.