Fundamentals Of Atomic Force Microscopy - Part I: Foundations
Published on 12. November 2015
Book
Hardback
340 pages
978-981-4630-34-4 (ISBN)
Description
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to "Fundamentals of AFM", an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
More details
Series
Language
English
Place of publication
Singapore
Singapore
Target group
College/higher education
Dimensions
Height: 235 mm
Width: 157 mm
Thickness: 23 mm
Weight
647 gr
ISBN-13
978-981-4630-34-4 (9789814630344)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Person
Content
Introduction to Scanning Probe Microscopy; The Force between Molecules; Simple Models for Molecule-Molecule Interactions; van der Waals Interactions between Macroscopic Objects; When the Tip Contacts the Substrate: Contact Mechanics; Quasi-Static Cantilever Mechanics; AFM System Components; Contact Mode AFM; Experimental Calibrations; Computer-Aided AFM Simulations;