
Power Modeling and Characterization of Computing Devices
A Survey
Sherief Reda(Author)
now publishers Inc
1st Edition
Published on 30. May 2012
Book
Paperback/Softback
110 pages
978-1-60198-560-6 (ISBN)
Description
Power consumption has emerged as the number one challenge towards improving the performance of future computing systems. Power Modeling and Characterization of Computing Devices: A Survey provides an overview of techniques in power modeling and characterization for three computing substrates: general-purpose processors, system-on-chip-based embedded systems, and field programmable gate arrays. It describes the basic principles that govern power consumption in digital circuits, and utilizes these principles to describe high-level power modeling techniques for designs of the three computing substrates. Once a computing device is fabricated, direct measurements on the actual device reveal a great wealth of information about the device's power consumption under various operating conditions. This monograph discusses characterization techniques that integrate infrared imaging with electric current measurements to generate runtime power maps. The power maps can be used to validate design-time power models and to calibrate computer-aided design tools. The monograph also describes empirical power characterization techniques for software power analysis and for adaptive power-aware computing. It concludes by outlining four promising future research areas. Power Modeling and Characterization of Computing Devices: A Survey is an invaluable reference for anyone with an interest in power consumption and how it affects the performance of computing systems.
More details
Series
Language
English
Place of publication
Hanover
United States
Target group
College/higher education
Dimensions
Height: 234 mm
Width: 156 mm
Thickness: 6 mm
Weight
167 gr
ISBN-13
978-1-60198-560-6 (9781601985606)
DOI
10.1561/1000000022
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Schweitzer Classification
Content
1: Introduction 2: Background: Basics of Power Modeling 3: Pre-Silicon Power Modeling Techniques 4: Post-Silicon Power Characterization 5: Future Directions Acknowledgements. Notations and Acronyms. References.