Phase Estimation in Optical Interferometry
Published on 19. October 2016
Book
Paperback/Softback
366 pages
978-1-138-03365-8 (ISBN)
Description
Phase Estimation in Optical Interferometry covers the essentials of phase-stepping algorithms used in interferometry and pseudointerferometric techniques. It presents the basic concepts and mathematics needed for understanding the phase estimation methods in use today.
The first four chapters focus on phase retrieval from image transforms using a single frame. The next several chapters examine the local environment of a fringe pattern, give a broad picture of the phase estimation approach based on local polynomial phase modeling, cover temporal high-resolution phase evaluation methods, and present methods of phase unwrapping. The final chapter discusses experimental imperfections that are liable to adversely influence the accuracy of phase measurements.
Responding to the push for the deployment of novel technologies and fast-evolving techniques, this book provides a framework for understanding various modern phase estimation methods. It also helps readers get a comparative view of the performance and limitations of the approaches.
The first four chapters focus on phase retrieval from image transforms using a single frame. The next several chapters examine the local environment of a fringe pattern, give a broad picture of the phase estimation approach based on local polynomial phase modeling, cover temporal high-resolution phase evaluation methods, and present methods of phase unwrapping. The final chapter discusses experimental imperfections that are liable to adversely influence the accuracy of phase measurements.
Responding to the push for the deployment of novel technologies and fast-evolving techniques, this book provides a framework for understanding various modern phase estimation methods. It also helps readers get a comparative view of the performance and limitations of the approaches.
More details
Language
English
Place of publication
London
United Kingdom
Publishing group
Taylor & Francis Ltd
Target group
College/higher education
Advanced undergraduate and graduate students in physics and engineering; academic and industrial researchers; practicing metrologists and engineers.
Illustrations
305 s/w Abbildungen, 17 farbige Abbildungen, 8 s/w Tabellen
8 Tables, black and white; 17 Illustrations, color; 305 Illustrations, black and white
Dimensions
Height: 234 mm
Width: 156 mm
Thickness: 20 mm
Weight
559 gr
ISBN-13
978-1-138-03365-8 (9781138033658)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Pramod Rastogi | Erwin Hack
Phase Estimation in Optical Interferometry
E-Book
11/2014
CRC Press
€116.99
Available for download
Pramod Rastogi | Erwin Hack
Phase Estimation in Optical Interferometry
E-Book
11/2014
1st Edition
CRC Press
€116.99
Available for download
Pramod Rastogi | Erwin Hack
Phase Estimation in Optical Interferometry
Book
11/2014
1st Edition
CRC Press
€283.50
Article not available at the moment
Persons
Professor Pramod Rastogi is the author or coauthor of over 150 scientific papers in peer-reviewed archival journals, the author of encyclopedia articles, and editor of several books in the field of optical metrology. Professor Rastogi is also the co-editor-in-chief of the International Journal of Optics and Lasers in Engineering. A recipient of the 2014 SPIE Dennis Gabor Award, he is a member of the Swiss Academy of Engineering Sciences and a fellow of the Society of the Photo-Optical Instrumentation Engineers and the Optical Society of America. He received a PhD from the University of Franche Comte.
Dr. Erwin Hack is a senior scientist at EMPA, lecturer at ETH Zurich, associate editor of Optics and Lasers in Engineering, vice chair of CEN WS71 on validation of computational solid mechanics models using strain fields from calibrated measurement (VANESSA), vice president of the Swiss Society for Non-Destructive Testing, and a member of EOS and OSA. Dr. Hack has authored or coauthored more than 80 papers in peer-reviewed journals and conferences and coedited the book Optical Methods in Solid Mechanics. He received a PhD in physical chemistry from the University of Zurich. His research interests include THz imaging, digital speckle pattern interferometry, and thermography.
Dr. Erwin Hack is a senior scientist at EMPA, lecturer at ETH Zurich, associate editor of Optics and Lasers in Engineering, vice chair of CEN WS71 on validation of computational solid mechanics models using strain fields from calibrated measurement (VANESSA), vice president of the Swiss Society for Non-Destructive Testing, and a member of EOS and OSA. Dr. Hack has authored or coauthored more than 80 papers in peer-reviewed journals and conferences and coedited the book Optical Methods in Solid Mechanics. He received a PhD in physical chemistry from the University of Zurich. His research interests include THz imaging, digital speckle pattern interferometry, and thermography.
Content
Fourier Fringe Demodulation. Windowed Fourier Transforms. Continuous Wavelet Transforms. The Spiral Phase Transform. Regularized Phase Estimation Methods in Interferometry. Local Polynomial Phase Modeling and Estimation. Signal-Processing Methods in Phase-Shifting Interferometry. Phase Unwrapping. Uncertainty in Phase Measurements. Index.