
Optical Measurement Techniques and Applications
Pramod Rastogi(Author)
Artech House Publishers
Published on 1. June 1997
Book
Hardback
433 pages
978-0-89006-516-7 (ISBN)
Description
Significant advances in optical metrology have fuelled the development of innovative techniques for the technology in a wide range of applications. Underlying the principles behind up-to-date optical measurement techniques, this work uses example diagrams and step-by-step equations, showing how these methods are used in real-world applications, from laser remote-sensing and vibration measurement, to providing the data necessary to develop computer models. The book also aims to prepare the reader to meet future optical measurement challenges by identifying what areas of research are on the horizon.
More details
Edition
Unabridged edition
Language
English
Place of publication
Norwood
United States
Target group
College/higher education
Professional and scholarly
Edition type
Unabridged edition
Dimensions
Height: 152 mm
Width: 229 mm
ISBN-13
978-0-89006-516-7 (9780890065167)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Content
Introduction (P.K. Rastogi). Optical Metrology of Engineering Surfaces -- Scope and Trends (H.J. Tiziani). Digital Processing of Fringe Patterns in Optical Metrology (W. Osten, W. J?ptner). Interferometric Optical Testing (D. Briers). Holographic Interferometry -- An Important Tool in Nondestructive Measurement and Testing (P.K. Rastogi). Speckle Photography, Shearography, and ESPI (C. Joenathan). Photoelasticity and Moire (A. Asundi). Optical Fiber Sensors (A.D. Kersey). Fiber Optic Smart Sensing (D. Inaudi). Holographic Metrology of Micro-Objects in a Dynamic Volume (C.S. Vikram). Particle Image Velocimetry (I. Grant). Surface Roughness Measurement (J.M. Bennet). Lidar for Atmospheric Remote Sensing (U.N. Singh). Some Other Methods in Optical Metrology (S. Krishnaswamy, T.C. Philip Chu, I. Saxena, H.G. Maas).