Reliability, Testing, and Characterization of MEMS/MOEMS
Rajeshuni Ramesham(Author)
SPIE Press
Published on 31. March 2003
Book
Paperback/Softback
324 pages
978-0-8194-4286-4 (ISBN)
More details
Series
Language
English
Place of publication
Bellingham
United States
Target group
Professional and scholarly
ISBN-13
978-0-8194-4286-4 (9780819442864)
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Schweitzer Classification