Advances in Materials Characterization
1st Edition
Published on 29. January 2007
Book
Hardback
204 pages
978-1-4200-4729-5 (ISBN)
Description
Materials characterization is an important area of fundamental and technological interest. Over the years, a variety of experimental techniques have been developed for characterizing the physical and chemical properties of materials. Advances in Materials Characterization offers an overview of this continually emerging discipline by providing an in-depth exploration of the latest techniques. It brings together a highly authoritative collection of articles written by experts from across the world who have been active in pioneering the techniques. Each chapter provides an introduction and an overview of the technique, and then proceeds to demonstrate its application to selected problems.
More details
Language
English
Place of publication
Bosa Roca
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 254 mm
Width: 178 mm
Weight
735 gr
ISBN-13
978-1-4200-4729-5 (9781420047295)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Indira Gandhi Centre for Atomic Research, Tamil Nadu, India Indira Gandhi Centre for Atomic Research, Tamil Nadu, India High Pressure Science Lab, University of Hawaii, Manoa
Content
Preface
Introduction to Materials Characterization; Baldev Raj, G. Amarendra and M. H. Manghnani
Atomistic Characterization of Materials using Scanning Tunneling Microscopy (STM); Prof. S. Dharmadhikari, India
Recent Advances in Characterization of Materials using Electron Microscopy; Dr. M. Vijayalakshmi, India
X-ray Reflectance for Characterization of Multilayer Thin Films; Prof. Ajay Gupta, India
in national and international journals.
Latest Trends in Acoustic NDT Studies for Materials Characterization; Prof. C. H. Chen, USA, T. Jayakumar and Anish Kumar, India
Characterization of Soft Condensed Matter using Confocal Microscopy; Dr. B.V. R. Tata and Dr. Baldev Raj, India
Positron Annihilation Studies of Materials for Electronic Devices; Prof. R.. Suzuki, Japan and Dr.G . Amarendra, India
Elasticity Characterization of Covalent (B-C-N) Hard Materials and Films by Brillouin Scattering; Prof. P.V. Zinn and Prof. M.H, Manghnani, USA
Introduction to Materials Characterization; Baldev Raj, G. Amarendra and M. H. Manghnani
Atomistic Characterization of Materials using Scanning Tunneling Microscopy (STM); Prof. S. Dharmadhikari, India
Recent Advances in Characterization of Materials using Electron Microscopy; Dr. M. Vijayalakshmi, India
X-ray Reflectance for Characterization of Multilayer Thin Films; Prof. Ajay Gupta, India
in national and international journals.
Latest Trends in Acoustic NDT Studies for Materials Characterization; Prof. C. H. Chen, USA, T. Jayakumar and Anish Kumar, India
Characterization of Soft Condensed Matter using Confocal Microscopy; Dr. B.V. R. Tata and Dr. Baldev Raj, India
Positron Annihilation Studies of Materials for Electronic Devices; Prof. R.. Suzuki, Japan and Dr.G . Amarendra, India
Elasticity Characterization of Covalent (B-C-N) Hard Materials and Films by Brillouin Scattering; Prof. P.V. Zinn and Prof. M.H, Manghnani, USA