Principles and Applications of Ion Scattering Spectrometry
Surface Chemical and Structural Analysis
Will be published approx. on 29. October 2002
Book
Hardback
336 pages
978-0-471-20277-6 (ISBN)
Description
The first authoritative account of ion scattering spectrometry for both students and researchers
Ion scattering spectrometry, a powerful analytical tool used to determine the structure and composition of a substance, addresses critical problems in semiconductors, thin film growth, coatings, computer chips, magnetic storage devices, bioreactive surfaces, catalytic surfaces, and electrochemical surfaces (including the large battery industry). Principles and Applications of Ion Scattering Spectrometry: Surface Chemical and Structural Analysis represents the first and only book on this exciting field, seamlessly merging theoretical fundamentals with cutting-edge practical applications.
Author J. Wayne Rabalais, the world's leading expert in ion scattering spectrometry, recognizes both the pedagogic and research needs of such a text and divides his work accordingly. Chapters 1 through 5 address senior undergraduates and beginning graduate students in chemical physics and include figures and illustrative diagrams intended to exemplify the discussions. Chapters 6 through 9 comprise material on the brink of current research and contain specific references to other sources at the end of each; further, chapter 10 is a bibliography of ion scattering publications. Topics covered include:
* Introductory, theoretical, and experimental aspects of ion scattering
* General features and structural analysis
* The recent technique of scattering and recoiling imaging spectrometry
* Examples of structural analysis
* Ion-surface charge exchange phenomena
* Hyperthermal ion-surface interactions
Engineers, researchers, professors, and postdoctoral associates involved in surface analysis, surface science, and studies of surfaces of materials will find Rabalais' incomparable study a seminal moment in the advance of ion scattering spectrometry.
Reviews / Votes
"Written with the needs of both students and researchers in mind, this volume is the first book devoted exclusively to ion scattering spectrometry." (Spectroscopy, Vol. 17, No. 12, December 2002) "This...is the first treatise on ion scattering and recoiling spectroscopy...recommended." (Choice, Vol. 40, No. 7, March 2003)"...I learned a lot from this book and highly recommend it to all surface scientists and mass spectrometrists." (Journal of the American Chemical Society, Vol. 125, No. 20, 2003)
"...useful monograph...recommended...a good reference book that is strong on the principles and limited to one part of the 'applications' of ion scattering spectrometry." (Applied Spectroscopy, Vol. 57, No.8, August 2003)
More details
Product info
gebunden
Series
Edition
1. Auflage
Language
English
Place of publication
United States
Publishing group
John Wiley & Sons Inc
Target group
Professional and scholarly
Product notice
sewn/stitched
Cloth over boards
Illustrations
Drawings: 155 B&W, 0 Color
Dimensions
Height: 248 mm
Width: 155 mm
Thickness: 22 mm
Weight
603 gr
ISBN-13
978-0-471-20277-6 (9780471202776)
Schweitzer Classification
Person
J. WAYNE RABALAIS, PhD, is the leading researcher in the world on ion scattering spectrometry. He is also the author of Low Energy Ion-Surface Interactions and Principles of Ultraviolet Photoelectron Spectroscopy, both with Wiley.
Content
Series Preface.
Preface.
1. Introduction.
1.1. Ion Scattering Spectrometry.
1.2. Importance of Surfaces.
1.3. Survey of Ion-Surface Interactions.
1.4. Historical Development of Ion Scattering Spectrometry.
1.5. Other Types of Ion Spectrometeries.
1.6. Features of Ion Scattering Spectra.
2. Theoretical Description of Atomic Collisions.
2.1. Kinematics of Atomic Collisions.
2.2. Dynamics of Atomic Collisions.
2.3. Multiple Collisions.
Appendix 2.1. Generalized Deflection Function.
3. Experimental Methods.
3.1 General Description of an Ion Scattering Spectrometer System.
3.2. Time-of-Flight Scattering and Recoiling Spectrometer.
3.3. Coaxial Scattering Spectrometer.
3.4. Scattering and Recoiling Imaging Spectrometer.
3.5. Mass and Charge Selection of Pulsed Ion Beams Using Sequential Deflection Pulses.
3.6. Ion Scattering and Recoiling from Liquid Surfaces.
4. General Features of Ion Scattering and Recoiling Spectra.
4.1. Energy Spectra.
4.2. Time-of-Flight Spectra.
4.3. Recoiling Spectra without Scattering Spectra.
4.4. Sampling Depth.
4.5. Attributes of the Ion Scattering Technique.
4.6. Comparison to Other Surface Elemental Analysis Techniques.
5. Structural Analysis from Time-of-Flight Scattering and Recoiling Spectrometry.
5.1. Atomic Collisions in the keV Range.
5.2. Structure Analysis.
5.3. Azimuthal Alignment of the Incident Ion Beam.
5.4. TOF-SARS and LEED.
6. Real-Space Surface Crystallography from Scattering and Recoiling Imaging Spectrometry.
6.1. An Imaging Spectrometry from Nature's Own Atomic Lenses.
6.2. Shadowing and Blocking.
6.3. Azimuthal Equidistant Mapping and Projection of SARIgrams.
6.4. Simulated and Experimental SARIgrams.
6.5. Termination Layer of CdS(0001).
6.6. Chemisorption Site of Chlorine on Ni(110).
6.7. Quantitative Analysis of the Pt(111) Surface.
6.8. Direct Detection of Hydrogen Atoms on Pt(111).
6.9. Interpretation of SARIgrams.
6.10. Quantitative Analysis of SARIS Images.
6.11. Advantages of SARIS.
7. Applications of TOF-SARS and SARIS to Surface Structure Analysis.
7.1. Clean Surfaces: Reconstruction and Relaxation.
7.2. Hydrogen on Surfaces.
7.3. Oxygen on Surfaces.
7.4. Metal Oxide Surfaces.
7.5. Organic Molecules on Surfaces.
7.6. Semiconductor Surfaces.
7.7. Epilayers on Nickel.
8. Ion-Surface Charge Exchange and Inelastic Energy Losses.
8.1. Charge Exchange Processes and Interactions.
8.2. Examples of Experimental Studies-Charge Exchange Phenomena.
8.3. Theoretical Methods.
9. Hyperthermal Reactive Ion Scattering for Molecular Analysis on Surfaces.
9.1. Introduction.
9.2. Characteristic Features of Hyperthermal Ion-Surface Collisions.
9.3. Reactive Ion Scattering of Hyperthermal Cs+ Beams.
9.4. Application of the Cs+ RIS Technique.
9.5. Summary.
10. Bibliography of Ion Scattering Publications.
Index.