8th International Symposium on Advanced Optical Manufacturing and Testing Technologies
Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
Published on 30. December 2016
Book
Paperback/Softback
126 pages
978-1-62841-922-1 (ISBN)
Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
More details
Series
Language
English
Place of publication
Bellingham
United States
Target group
Professional and scholarly
Dimensions
Height: 229 mm
Width: 152 mm
ISBN-13
978-1-62841-922-1 (9781628419221)
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Schweitzer Classification