
Introduction to Semiconductor Device Yield Modeling
Albert V.Ferris- Prabhu(Author)
Artech House Publishers
Published on 31. July 1992
Book
Hardback
108 pages
978-0-89006-450-4 (ISBN)
Description
This text, the first of its kind, delivers a systematically organized introduction to the theory and practice of yield prediction. The book addresses the economic need for accurate yield prediction, and clarifies the important role it plays in the semiconductor industry.
More details
Series
Edition
New
Language
English
Place of publication
Norwood
United States
Target group
College/higher education
Professional and scholarly
Product notice
Laminated cover
Illustrations
black & white illustrations
Dimensions
Height: 235 mm
Width: 161 mm
Thickness: 12 mm
Weight
304 gr
ISBN-13
978-0-89006-450-4 (9780890064504)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Content
Yield. Fault Probability. Effect of Defect Sizes on the Fault Probability. Counting Techniques. Yield Equations. Defect Density and Scaling Rules. Yield Prediction. Yield With Redundancy. A Yield Comparison. Productivity. Conclusion. References.