Scanning Microscopies 2011
Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek(Author)
SPIE Press
Published on 1. December 2011
Book
Paperback/Softback
254 pages
978-0-8194-8610-3 (ISBN)
More details
Language
English
Place of publication
Bellingham
United States
Target group
College/higher education
Professional and scholarly
Illustrations
Illustrations
Dimensions
Height: 229 mm
Width: 152 mm
ISBN-13
978-0-8194-8610-3 (9780819486103)
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Schweitzer Classification