Microelectronic Reliability: Integrity, Assessment and Assurance v. 2
Integrity Assessment and Assurance
Published on 1. April 1989
Book
Hardback
556 pages
978-0-89006-350-7 (ISBN)
Description
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
More details
Series
Language
English
Place of publication
Norwood
United States
Target group
College/higher education
Professional and scholarly
Edition type
Bilingual edition
Product notice
Laminated cover
Illustrations
1, black & white illustrations
Dimensions
Height: 235 mm
Width: 161 mm
Thickness: 41 mm
Weight
1089 gr
ISBN-13
978-0-89006-350-7 (9780890063507)
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Schweitzer Classification