Advanced Mathematical And Computational Tools In Metrology And Testing Ix
Published on 27. March 2012
Book
Hardback
468 pages
978-981-4397-94-0 (ISBN)
Description
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Goeteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
More details
Series
Language
English
Place of publication
Singapore
Singapore
Target group
College/higher education
Researchers, graduate students, academics and professionals in metrology.
Dimensions
Height: 235 mm
Width: 157 mm
Thickness: 30 mm
Weight
826 gr
ISBN-13
978-981-4397-94-0 (9789814397940)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Content
Recommended Tools for Sensitivity Analysis Associated to the Evaluation of Measurement Uncertainty (A Allard and N Fischer)
Case Study of Likelihood and Bayes Approaches for Measurement Based on Nonlinear Regression (A Bariska and R Bürgin)
Uncertainty Modeling in 3D SEM Stereophotogrammetry (L Carli, M Galetto and G Genta)
Software to Support the Use of GUM Supplement 2 - Extension to Any Number of Output Quantities (M G Cox, P M Harris and I M Smith)
Probabilistic Characterization of Face Measurement (F Crenna, G B Rossi and L Bovio)
Modeling Expert Knowledge to Assign Consensus Values in Proficiency Tests (S Demeyer and N Fischer)
A Two-Stage MCM/MCMC Algorithm for Uncertainty Evaluation (A B Forbes)
Data Fusion Techniques for Cylindrical Surface Measurements (M Galovska, R Tutsch and O Jusko)
Stochastic Modeling Aspects for an Improved Solution of the Inverse Problem in Scatterometry (H Gross, M-A Henn, A Rathsfeld and M Bär)
On the Difference of Meanings of "Zero Correction": Zero Value Versus No Correction, and of the Associated Uncertainties (F Pavese)
Uncertainty & Risks in Decision-Making in Qualitative Measurement: An Information-Theoretical Approach (L R Pendrill)
Theory of AND Computation Program for Determination of the Reference Value in Key Comparisons Based on Bayesian Statistics (K Shirono, H Tanaka and K Ehara)
and other papers
Case Study of Likelihood and Bayes Approaches for Measurement Based on Nonlinear Regression (A Bariska and R Bürgin)
Uncertainty Modeling in 3D SEM Stereophotogrammetry (L Carli, M Galetto and G Genta)
Software to Support the Use of GUM Supplement 2 - Extension to Any Number of Output Quantities (M G Cox, P M Harris and I M Smith)
Probabilistic Characterization of Face Measurement (F Crenna, G B Rossi and L Bovio)
Modeling Expert Knowledge to Assign Consensus Values in Proficiency Tests (S Demeyer and N Fischer)
A Two-Stage MCM/MCMC Algorithm for Uncertainty Evaluation (A B Forbes)
Data Fusion Techniques for Cylindrical Surface Measurements (M Galovska, R Tutsch and O Jusko)
Stochastic Modeling Aspects for an Improved Solution of the Inverse Problem in Scatterometry (H Gross, M-A Henn, A Rathsfeld and M Bär)
On the Difference of Meanings of "Zero Correction": Zero Value Versus No Correction, and of the Associated Uncertainties (F Pavese)
Uncertainty & Risks in Decision-Making in Qualitative Measurement: An Information-Theoretical Approach (L R Pendrill)
Theory of AND Computation Program for Determination of the Reference Value in Key Comparisons Based on Bayesian Statistics (K Shirono, H Tanaka and K Ehara)
and other papers