Design and Analysis of Accelerated Life Tests
Rong Pan(Author)
Chapman & Hall/CRC (Publisher)
1st Edition
Will be published approx. on 28. August 2026
Book
Hardback
304 pages
978-1-4987-5344-9 (ISBN)
Description
Accelerated life tests (ALTs) have become an indispensable tool for reliability engineers to quantify a product's reliability, and for product managers to make product release decisions. However, there are many common misuses of ALTs and misinterpretations of their results. This book provides a framework for the proper design and analysis of ALTs. It compares ALTs with other industrial testing experiments, and provides guidance on their appropriate application. It features lots of examples using real data from industrial experiments, and provides statistical software for their implementation. It can be used as a textbook for students of reliability, or as a reference for practitioners
More details
Language
English
Place of publication
Boca Raton
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
Illustrations
50 s/w Abbildungen
50 Illustrations, black and white
Dimensions
Height: 234 mm
Width: 156 mm
Weight
453 gr
ISBN-13
978-1-4987-5344-9 (9781498753449)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
E-Book
12/2023
1st Edition
Taylor & Francis
€42.99
Not yet available
E-Book
12/2023
1st Edition
Taylor & Francis
€42.99
Not yet available
Person
Content
Introduction to Reliability Testing; Lifetime distributions; Acceleration models; Planning ALTs with Single Stress Factor; Planning ALTs with Multiple Stress Factors; Test Plans for Model Checking; Tests with Blocking and Subsampling; Other reliability tests.