Advances in X-Ray Analysis
Volume 10
Published on 12. June 2012
Book
Paperback/Softback
IX, 558 pages
978-1-4684-7837-2 (ISBN)
Description
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
More details
Edition
Softcover reprint of the original 1st ed. 1967
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Illustrations
220 s/w Abbildungen
IX, 558 p. 220 illus.
Dimensions
Height: 254 mm
Width: 178 mm
Thickness: 31 mm
Weight
1061 gr
ISBN-13
978-1-4684-7837-2 (9781468478372)
DOI
10.1007/978-1-4684-7835-8
Schweitzer Classification
Other editions
Additional editions
Book
12/1995
1st Edition
Kluwer Academic/Plenum Publishers
€85.55
Article exhausted; check different version
Content
X-Ray Diffraction Topography.- Contrast of Dislocation Images in X-Ray Transmission Topography.- The Asymmetric Bragg Reflection and Its Application in Double Diffractometry.- Experimental Determination of the Integrated Contribution of Temperature Diffuse Scattering in X-Ray Reflections.- The X-Ray Diffraction Image of a Stacking Fault.- Dynamical Theory for Simultaneous X-Ray Diffraction.- Measuring Techniques of Parallel-Beam-Diffraction Micrography.- Some Recent Applications of X-Ray Topography.- The Dilemma of Anomalous X-Ray Reflections.- X-Ray Diffraction Microscopy of Planar Diffused Junction Structures.- Experimental Procedures in X-Ray Diffraction Topography.- X-Ray Diffraction Contrast from Impurity Precipitates in CdS Single Crystals.- Lang X-Ray Topographic Studies of Ruby Grown by Different Methods.- The Analysis of Berg-Barrett Skew Reflections and Their Applications in the Observation of Process-Induced Imperfections in (111) Silicon Wafers.- The Effect of Small Additions of Magnesium on the Preprecipitation Behavior of Al-Zn Alloys.- Analysis of High Angle Diffuse Scattering from Small Platelets.- X-Ray Diffraction Study of Ordering in Two Sigma Phases.- A Study of the Unusual Line Structure in Powder Patterns of Pyrolytically Deposited Boron Compounds and Other Materials.- The Expansion upon Cooling of Thick Cu2O Films Grown on Copper Substrates.- New Results on the Iron-Nickel Equilibrium Diagram-The Gamma/Gamma-Plus-Alpha Boundary.- Lattice Constant and Crystallite Size of Condensed Gold Vapor.- Line Shape Analysis of Deformed Cu-Ge Alloys.- Anomalous Residual Stresses.- Experimental Factors Concerning X-Ray Residual Stress Measurements in High-Strength Aluminum Alloys.- X-Ray Measurement of Residual Stresses in Titanium Alloy Sheet.- TheApplication of X-Ray Diffraction Techniques to the Study of Wear.- X-Ray Analysis of Fatigue Damage in Copper.- Improvement of Accuracy in Representation of Conventional Pole Figures.- Precision Lattice Parameter Determination at Liquid Helium Temperatures by Double-Scanning Diffractometry.- Numerical Control X-Ray Powder Diffractometry.- The Effects of Electronic Structure and Interatomic Bonding on the Soft X-Ray Al K Emission Spectrum from Aluminum Binary Systems.- Multilayer Soap Film Structures.- Production Efficiencies of X-Ray Emission Spectra by Proton Bombardment.- Electron Microprobe Analyses and X-Ray Diffraction Study of SrSi2.- The Application of the Electron Microprobe in the Analysis of Nuclear Fuel Meltdown Experiments.- Preparation of Electron Probe Microanalyzer Standards Using a Rapid Quench Method.- Quantitative Microprobe Analysis by Means of Target Current Measurements.- A Comparison of Four Slit Apertures for Selected-Area Analysis with the X-Ray Secondary-Emission Spectrometer.- The Analysis of the Light Elements in Ferrotitanium Ores and Residues of Widely Varying Composition by X-Ray Spectrography.- A Glass Fusion Method for X-Ray Fluorescence Analysis.- Quantitative X-Ray Emission Analysis of Magnesium Through Fluorine with X-Ray and Electron Excitation.- A Method of Liquid Analyses Providing Increased Sensitivity for Light Elements.- The Demountable Tube in Light Element Fluorescence Analysis.- Characteristics of Flow Proportional Counters for X-Rays.- Author Index.