
Thermal non-destructive testing and evaluation of solids
A novel time domain analysis approach for TNDT
LAP Lambert Academic Publishing
Published on 18. October 2017
Book
Paperback/Softback
116 pages
978-620-2-05854-4 (ISBN)
Description
This book presents recent advances in thermal/infrared non-destructive testing and evaluation of solid materials by pulse compression favorable non-periodic thermal excitation schemes. It puts together concise and complete information on pulse compression favorable thermal non-destructive testing and evaluation (TNDT&E) methods for industrial inspection of wide verity of materials. This book will help practicing engineers from various disciplines to implement nondestructive evaluation methods on the production line and enhance their knowledge of industrial inspection techniques. It can also be used as a teaching aid at universities especially involved in testing and evaluation of materials. Finally research centres will find it valuable as a reference book for TNDT&E.
More details
Language
English
Dimensions
Height: 220 mm
Width: 150 mm
Thickness: 8 mm
Weight
191 gr
ISBN-13
978-620-2-05854-4 (9786202058544)
Schweitzer Classification
Persons
Dr. Ravibabu Mulaveesala is an Associate Professor in the Department of Electrical Engineering at Indian Institute of Technology Ropar (India). Dr. Vanita Arora is a Post Doctoral Researcher in the Department of Electrical Engineering at Indian Institute of Technology Ropar (India).