Advances in X-Ray Analysis
Volume 7 Proceedings of the Twelfth Annual Conference on Applications of X-Ray Analysis Held August 7-9, 1963
Published on 26. April 2013
Book
Paperback/Softback
X, 662 pages
978-1-4684-8639-1 (ISBN)
Description
Consider for a few moments the staggering magnitude of technological advance which has occurred since the birth four centuries ago of that early progenitor of the scientific method, Galileo. Think also about the extent of scientific knowledge avail able during the lifetime of Galileo and his associates; knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world's scientific knowledge. New developments - expanded technological concepts - occur with dazzling rapidity, often faster than they can be assimilated. At the same time there are practical limitations to the extent of formal education. Continuing education, upgrading of scientific know-how, retraining to assure full utilization of existing knowledge - these are urgent problems which today confront the nation's scientific community. And there is never enough time. The problem is compounded by the increasing burden of information retrieval.
More details
Edition
Softcover reprint of the original 1st ed. 1964
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Illustrations
4 farbige Abbildungen, 208 s/w Abbildungen
X, 662 p. 212 illus., 4 illus. in color.
Dimensions
Height: 254 mm
Width: 178 mm
Thickness: 37 mm
Weight
1257 gr
ISBN-13
978-1-4684-8639-1 (9781468486391)
DOI
10.1007/978-1-4684-8637-7
Schweitzer Classification
Other editions
Additional editions
William M. Mueller | Gavin R. Mallett | Marie Fay
Advances in X-Ray Analysis: Proceedings of the Twelfth Annual Conference on Applications of X-Ray Analysis Held August 7-9, 1963 Volume 7
Book
12/1995
Kluwer Academic/Plenum Publishers
€109.13
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Content
The Atomic Order in Guinier-Preston Zones of Aluminum-Silver Alloys.- The Debye Temperature of Iron-Manganese Solid Solution Alloys.- Relation Between Ionic Radii and Transformation Temperature in Rare Earth Niobates.- The X-Ray Diffraction Measurement of Residual Stresses in Aluminum Alloys.- Analysis of the Broadening of Powder Pattern Peaks from Cold-Worked Face-Centered and Body-Centered Cubic Metals.- Dependence of Lattice Parameters on Various Angular Measures of Diffractometer Line Profiles.- Quantitative Determinations and Descriptions of Preferred Orientation.- A Graphical Solution for X-Ray Powder Diffraction Patterns.- A Systematic Method for Indexing Spots of Single Crystals in Laue X-Ray Photographs.- Prealloyed Iron-Nickel Powders by an Amalgamation Process.- An Explanation of Microstructures in the Tantalum-Carbon System.- X-Ray Diffractometric Examination of Low Temperature Phase Transformations in Single-Crystal Strontium Titanate.- Vacancy Related Defects in Antimony-Doped Silicon.- Depth of Saw and Lap Damage in Germanium.- Preferred Orientation in Ceramic Materials due to Forming Techniques.- A Qualitative X-Ray Examination of the Structure of Fiberglass Under Static Tensile Loading.- Precipitation of MgF2 in LiF.- A Study of Solid Solution Formation in the Milling of TiCl3-A1Cl3 Powder Mixtures.- New Technique for Quantitative SiO2 Determinations of Silicate Materials by X-Ray Diffraction Analysis of Glass.- A Study of Copper-Chromium Oxide Catalysts and a Method to Determine Catalytic Activities.- X-Ray Investigation of Aerosols from Wires Exploded in Nitrogen.- Oriented Crystallization of Amides on Collagen with Modification of the Collagen Lattice.- Technique of Measuring Low Percentages of Retained Austenite Using Filtered X-RayRadiation and an X-Ray Diffractometer.- A Vertically Rotating Double-Crystal X-Ray Spectrometer.- Increasing the Versatility of the G. E. Diffractometer.- The Design and Use of Special Purpose Attachments for the Horizontal Diffractometer.- A Single-Crystal Orienter for the Philips Wide-Range Goniometer.- An X-Ray Absorption Method for Elemental Analysis.- Interrelationships of Sample Composition, Backscatter Coefficient, and Target Current Measurement.- Limitations of the Linear Intensity-Concentration Approximation in Electron Probe Microanalysis.- Observations Concerning the Interdiffusion of Columbium Alloy with Type 316 Stainless Steel.- Beam Quality in the Electron Probe Microanalyzer.- Instrumental Developments for Electron Microprobe Readout.- Methods of Quantitative Electron Probe Analysis.- The Applicability of Theoretically Calculated Intensity Corrections to Practical Metallurgical Problems in the Electron Probe.- Standards in Electron Probe Analysis of Minerals.- Panel Discussion on Electron Microprobe.- Application of a Pulsed Soft X-Ray System to the Determination of Phosphor Response Characteristics.- X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron.- Experimental Dispersing Devices and Detection Systems for Soft X-Rays.- A Comparison of the Performance of Gratings and Crystals in the 20-115 Å Region.- Evaluation of a Demountable X-Ray Tube Vacuum Spectrograph for the Determination of Low-Atomic-Number Elements.- The Accurate Determination of Major Constituents by X-Ray Fluorescent Analysis in the Presence of Large Interelement Effects.- Detection Confirmation and Determination of Trace Amounts of Selenium by X-Ray Methods.- Mineralogical Problems in X-Ray Emission Analysis of Sylvite Concentrates.- X-RaySpectrometric Determination of Composition and Distribution of Sublimates in Receiving-Type Electron Tubes.- The Determination of Thorium in Monazite by Fluorescent X-Ray Spectrometry.- X-Ray Spectrographic Analysis of the 3-d, Transition Metal Corrosion Products Using Potassium Bromide Disks.- X-Ray Fluorescence Analysis of Niobate-Tantalate Ore Concentrates.- Improved Trace Analysis with the Use of Synchronized Electronic Discrimination in an X-Ray Scanning Procedure.- X-Ray Tube Parameters and their Effects on Fluorescence Analysis.- The Design and Performance of the Dual Function Spectrodiffractometer and Automatic Programmer.- Performance of an Unattended Automated X-Ray Spectrograph.- Author Index.