Advances in X-Ray Analysis
Volume 4 Proceedings of the Ninth Annual Conference on Application of X-Ray Analysis Held August 10-12 1960
Published on 3. May 2013
Book
Paperback/Softback
VIII, 568 pages
978-1-4684-8636-0 (ISBN)
Description
The Ninth Annual Conference on Applications of X-Ray Anal ysis sponsored by the University of Denver was held August 10, 11,12, 1960, at the Park Lane Hotel in Denver, Colorado. Forty one papers on new developments in X-ray analytical techniques and instrumentation were presented. This volume contains thirty eight of those papers. Research in X-ray analytical methods is a dynamic and expanding area of scientific investigation. Each year exciting and stimulating progress is reported in the various regions of this field. Suitable documentation of the results is the purpose of the series "Advances in X-Ray Analysis. " Participation in the Conference by two distinguished European scientists, Dr. Raymond Castaing of the University of Paris, France, and Dr. Arnold Hargreaves of the Manchester College of Science and Technology, England, was made possible through financial aid provided by the United States Office of Naval Re search. This assistance is greatly appreciated. Major contributions to the conference were made by the following individuals who chaired the technical sessions: Dr. William D. Forgeng, Electro Metallurgical Company, Niagara Falls, New York Dr. Kurt F. J. Heinrich, E. I. du Pont de Nemours and Company, Wilmington, Delaware Mr. Robert A. McCune, University of Denver, Denver, Colorado Dr. Dan McLachlan, Jr. , Stanford Research Institute, Menlo Park, California Dr. William H. Robinson, Carnegie Institute of Technology, Pittsburgh, Pennsylvania Dr.
More details
Edition
Softcover reprint of the original 1st ed. 1961
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Illustrations
144 s/w Abbildungen
VIII, 568 p. 144 illus.
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 32 mm
Weight
829 gr
ISBN-13
978-1-4684-8636-0 (9781468486360)
DOI
10.1007/978-1-4684-8634-6
Schweitzer Classification
Other editions
Additional editions
William M. Mueller
Advances in X-Ray Analysis: Proceedings of the Ninth Annual Conference on Application of X-Ray Analysis Held August 10-12 1960 Volume 4
Book
06/1961
Kluwer Academic/Plenum Publishers
€109.13
Article exhausted; check different version
Content
The Use of Optical Transforms in Crystal-Structure Analysis.- X-Ray Diffraction Investigation of BeO Calcination Processes.- Crystallite Size and Particle Size Measurements on BeO Powders by X-Ray Methods.- X-Ray Diffraction Investigation of Vacuum-Deposited Metallic Films.- The Use of Computer Techniques to Plot Pole Figures.- A Precise Determination of the Atomic Position Parameter for ?-Uranium.- The Debye Temperature of Carbonyl Iron.- Use of X-Ray Spectrometer Data in Radial Distribution Analysis of the Diffraction Patterns for Amorphous Materials.- A Technique for Studying Coprecipitated Chromia-Alumina Catalysts by X-Ray Diffraction.- X-Ray Studies of Basic Lead Azides.- Determination of Relative Stability of Urea Complexes from X-Ray Powder Diffraction Data.- Electrocrystallography of Cobalt and Cobalt-Nickel Alloys.- X-Ray Studies in the Ti-O System.- A New High-Power Microfocus X-Ray Diffraction Unit.- Design and Applications of a Variable-Temperature Diffractometer Specimen Mount.- A Simple Goniostat for the Norelco Diffractometer.- Counter Adaptor and Furnace for Weissenberg Camera.- A Study of Phase Reactions in a Complex 4.5 Al - 3.5 Ti - Ni Base Alloy.- Measurement in the 10 to 100 Angstrom X-Ray Region.- The Spectra of Some Beta-Excited X-Ray Sources with the Multichannel Analyzer.- A New Commercial X-Ray Projection Microscope.- An X-Ray Absorption Technique for Measurement of Coat Weight on Paper.- X-Ray Absorption Measurement of Steam Voids in Water at High Pressures.- Industrial Applications of X-Ray Methods for Measuring Plating Thickness.- The Fundamentals of Quantitative Electron Probe Microanalysis.- Pulse Height Selection in X-Ray Fluorescence.- The Effect of Particles and Surface Irregularities on the X-Ray Fluorescent Intensity of SelectedSubstances.- Fluorescent X-Ray Spectrographic Analyses of Amphibolite Rocks and Constituent Hornblendes.- The Evaluation and Improvement of X-Ray Emission Analysis of Raw-Mix and Finished Cements.- The Effects of Operating Variables in the Application of Multielement Calibration Systems for Fluorescent X-Ray Spectrographic Analyses of Mineral Samples.- X-Ray Spectrometric Determination of Copper, Tin, and Uranium in Bronze Heat-Treating Material.- X-Ray Fluorescence Analysis of Tungsten-Molbydenum Metals and Electrolytes.- Fluorescence Analysis of Trace Amounts of Hafnium in Zirconium Using a Silicon Crystal.- An Application of X-Ray Fluorescent Spectrography to Columbium Alloy Melting Practices.- Norelco Pin-Hole Attachment.- New Instruments for X-Ray Analysis.- Novel Features Incorporated in a New Automatic X-Ray Fluorescence Spectrometer.- A High-Speed, Selective Uniform-Particle-Size Grinder for the Preparation of Analytical Samples.- Author Index.